Browsing by imec author "823a379c6cab91e5056929f33191723c3b43ad66"
Now showing items 41-60 of 106
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Enhanced light coupling into nanostructured arrays as an enabler for advanced Raman-based metrology
Nuytten, Thomas; Bogdanowicz, Janusz; Gawlik, Andrzej; Oniki, Yusuke; Kenis, Karine; Muraki, Yusuke; Charley, Anne-Laure; Fleischmann, Claudia; De Wolf, Ingrid; van der Heide, Paul (2021) -
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN
Morris, Richard; Cuduvally, Ramya; Lin, Jhao-Rong; Zhao, Ming; Vandervorst, Wilfried; Thuvander, Mattias; Fleischmann, Claudia (2022-11) -
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann, Claudia; Conard, Thierry; Havelund, R.; Franquet, Alexis; Poleunis, C.; Voroshazi, Eszter; Delcorte, A.; Vandervorst, Wilfried (2013) -
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
Fundamental aspects of germanium surface passivation by gas phase oxidation and liquid phase sulfidation
Fleischmann, Claudia; Schouteden, Koen; Houssa, Michel; Sioncke, Sonja; Mueller, Matthias; Van Haesendonck, Chris; Temst, Kristiaan; Vantomme, Andre (2014) -
G-SIMS analysis of organic solar cell materials
Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried (2013) -
G-SIMS analysis of organic solar cell materials
Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; Voroshazi, Eszter; Poleunis, Claude; Havelund, Rasmus; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties
Resende, Joao; Van-Son Nguyen; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Ngoc Duy Nguyen (2021) -
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties (vol 11, 7788, 2021)
Resende, Joao; Nguyen, Van-Son; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Nguyen, Ngoc Duy (2021) -
Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
Hoenicke, Philipp; Fleischmann, Claudia; Hermann, Peter; Beckhoff, Burkhard (2014) -
HAXPES study of full high-k/metal gate stacks deposited on Ge substrates
Fleischmann, Claudia; Kalpyris, Ioannis; Conard, Thierry; Adelmann, Christoph; Sioncke, Sonja; Rueff, J.P.; Ablett, J.M.; Vandervorst, Wilfried (2013) -
High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them
Conard, Thierry; Fleischmann, Claudia; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015) -
Impact of ammonium sulfide solution on electronic prperties and ambient stability of germanium surfaces: towards Ge-based microelectronic devices
Fleischmann, Claudia; Schouteden, Koen; Müller, Matthias; Hönicke, Philipp; Beckoff, Burkhard; Sioncke, Sonja; Boyen, Hans-Gerd; Meuris, Marc; Van Haesendonck, Chris; Temst, Kristiaan; Vantomme, Andre (2013) -
Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried; Geiser, Brian; Bunton, Joe; Ulfig, Robert; Larson, Dave (2020) -
Improving APT-AFM technology: towards high resolution 3D APT tip shapes
Op de Beeck, Jonathan; Fleischmann, Claudia; Paredis, Kristof; Vandervorst, Wilfried (2018) -
Inorganic material profiling using Arn + cluster: Can we achieve high Quality profiles?
Conard, Thierry; Fleischmann, Claudia; Havelund, R.; Franquet, Alexis; Poleunis, Claude; Delcorte, Aranaud; Vandervorst, Wilfried (2013) -
Inorganic material profiling using Arn+ cluster: Can we achieve high-quality profiles?
Conard, Thierry; Fleischmann, Claudia; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2018-05) -
Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy
Chintala, Ravi Chandra; Tait, Jeffrey; Eyben, Pierre; Voroshazi, Eszter; Surana, Supriya; Fleischmann, Claudia; Conard, Thierry; Vandervorst, Wilfried (2016) -
Intermetallic Compounds as Alternatives to Copper for Advanced Interconnect Metallization
Adelmann, Christoph; Soulie, Jean-Philippe; Scheerder, Jeroen; Fleischmann, Claudia; Sankaran, Kiroubanand; Pourtois, Geoffrey; Swerts, Johan; Tokei, Zsolt (2023) -
Interplay between relaxation and defect formation, and atomic Sn distribution in Ge(1-x)Sn(x) unraveled with atom probe tomography
Kumar, Arul; Demeulemeester, Jelle; Bogdanowicz, Janusz; Melkonyan, Davit; Wang, Wei; Loo, Roger; Vandervorst, Wilfried; Fleischmann, Claudia; Gencarelli, Federica; Shimura, Yosuke (2015)