Browsing by author "Ogier, Jean-Luc"
Now showing items 1-8 of 8
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A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Degraeve, Robin; De Blauwe, Jan; Ogier, Jean-Luc; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Degraeve, Robin; Roussel, Philippe; Ogier, Jean-Luc; Groeseneken, Guido; Maes, Herman (1996) -
Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
Ogier, Jean-Luc; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1995) -
New insights in the impact of the breakdown mechanisms on the statistics of intrinsic and extrinsic breakdown in thin oxides
Groeseneken, Guido; Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Depas, Michel; Maes, Herman (1996) -
New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Ogier, Jean-Luc; Depas, Michel; Roussel, Philippe; Maes, Herman (1998) -
On the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
On the polarity dependence of oxide breakdown in MOS-devices with n+ and p+ polysilicon gate
Ogier, Jean-Luc; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (1996)