Browsing by author "Boudier, Dimitri"
Now showing items 1-15 of 15
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Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Cretu, Bogdan; Boudier, Dimitri; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine (2016) -
Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine (2018) -
Discussion of the flicker noise origin at very low temperature and polarization operation
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Claeys, Cor (2019) -
Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine (2018) -
Generation-recombination noise in advanced CMOS devices
Simoen, Eddy; Oliveira, Alberto; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula; Martino, Joao; Carin, Regis; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016) -
Impact of defects on transport in nanodevices
Simoen, Eddy; Hsu, Brent; Boudier, Dimitri; Cretu, Bogdan; Eneman, Geert; Collaert, Nadine; Claeys, Cor (2018-06) -
Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization
Cretu, Bogdan; Boudier, Dimitri; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine; Claeys, Cor (2020) -
Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Hellings, Geert; Schram, Tom; Mertens, Hans; Linten, Dimitri (2020) -
Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Hellings, Geert; Schram, Tom; Mertens, Hans; Linten, Dimitri (2019) -
Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Carin, Regis; Veloso, Anabela; Collaert, Nadine; Thean, Aaron (2017) -
Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine; Thean, Aaron (2016) -
On quantum effects and low frequency noise spectroscopy in Si gate-all-around nanowire MOSFETs at cryogenic temperatures
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine (2017) -
On trap identification in Gate-All-Around (GAA) Nanowire (NW) MOSFETs using Low Frequency Noise spectroscopy
Boudier, Dimitri; Cretu, Bogdan; Simoen, Eddy; Veloso, Anabela; Collaert, Nadine (2017) -
Processing impact of the low-frequency noise of 1.8 V input-output bulk FinFETs
Claeys, Cor; Hellings, Geert; Arimura, Hiroaki; Parvais, Bertrand; Ragnarsson, Lars-Ake; Dekkers, Harold; Schram, Tom; Linten, Dimitri; Horiguchi, Naoto; Simoen, Eddy; Boudier, Dimitri; Cretu, Bogdan (2019) -
Si/SiGe superlattice I/O finFETs in a vertically-stacked gate-all-around horizontal nanowire technology
Hellings, Geert; Mertens, Hans; Subirats, Alexandre; Simoen, Eddy; Schram, Tom; Ragnarsson, Lars-Ake; Simicic, Marko; Chen, Shih-Hung; Parvais, Bertrand; Boudier, Dimitri; Cretu, Bogdan; Machillot, Jerome; Pena, Vanessa; Sun, S.; Yoshida, N.; Kim, N.; Mocuta, Anda; Linten, Dimitri; Horiguchi, Naoto (2018)