Browsing by author "Mogilnikov, K. P."
Now showing items 1-13 of 13
-
Calculation of pore size distribution in the ellipsometric porosimetry: method and reliability
Mogilnikov, K. P.; Polovinkin, V. G.; Dultsev, F. N.; Baklanov, Mikhaïl (2000) -
Characterisation of porous dielectric films by ellipsometric porosimetry
Baklanov, Mikhaïl; Mogilnikov, K. P. (2000) -
Characterisation of porous low dielectric constant films by ellipsometric porosimetry
Baklanov, Mikhaïl; Mogilnikov, K. P. (2001) -
Characterization of low-k dielectric films by ellipsometric porosimetry
Baklanov, Mikhaïl; Mogilnikov, K. P. (2000) -
Characterization of low-k dielectric films by ellipsometric porosimetry
Baklanov, Mikhaïl; Mogilnikov, K. P. (2001) -
Comparative study of porous SOG films with different non-destructive instrumentation
Baklanov, Mikhaïl; Kondoh, Eiichi; Linskens, Frank; Gidley, D. W.; Lee, Hean-Cheal; Mogilnikov, K. P.; Sune, Jorge (2001) -
Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-K SiO2 xerogel films
Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2002) -
Comparison of techniques to characterize the density, porosity and elastic modules of porous low-k SiO2 xerogel films
Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2001) -
Determination of pore size distribution in thin films by ellipsometric posimetry
Baklanov, Mikhaïl; Mogilnikov, K. P.; Polovinkin, V. G.; Dultsev, F. N. (2000) -
Development of a non-destructive thin film porosimetry: pore size distribution and pore volume of porous silica
Baklanov, Mikhaïl; Dultsev, F. N.; Kondoh, Eiichi; Mogilnikov, K. P.; Maex, Karen; Wang, Sharon; Forester, Lynn (1999) -
Ellipsometric study of the change in the porosity of silica xerogels after surface chemical modification with hexamethyldisilizane
Himcinschi, C.; Friedrich, M.; Frühauf, S.; Streiter, I.; Schulz, S. E.; Gessner, T.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Zahn, D. R. T. (2001) -
Non-destructive characterisation of porosity and pore size distribution in porous low-k dielectric films
Baklanov, Mikhaïl; Mogilnikov, K. P. (2001) -
Non-destructive determination of pore size distribution of low-k porous SOG films
Baklanov, Mikhaïl; Kondoh, Eiichi; Gidley, D.; Lin, E.; Wu, Wen; Arao, H.; Mogilnikov, K. P.; Shamiryan, Denis; Nakashima, A. (2000)