Browsing by author "Porti, Marc"
Now showing items 1-9 of 9
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A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs
Wu, Qian; Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, Mario; Rodiguez, Rosanna; Velayudhan, Vikas; Nafria, Montserrat; Aymerich, Xavier; Gonzalez, Mireia B; Simoen, Eddy (2014) -
Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale
Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, M.; Rodriguez, Rosanna; Velayudhan, V.; Amat, Esteve; Nafria, Montse; Aymerich, X.; Gonzalez, Mireia B; Simoen, Eddy (2013) -
Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach
Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy (2015) -
Comparison of standard macroscopic and Conductive AFM leakage measurements on gate removed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Improved characterization of high-k degradation with vacuum C-AFM
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics
Aguilera, Lidia; Polspoel, Wouter; Volodin, Alexander; Van Haesendonck, Chris; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors
Bayerl, Albin; Lanza, Mario; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier; De Gendt, Stefan (2013) -
Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment
Aguilera, Lidia; Polspoel, Wouter; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008)