Browsing by author "Bock, Karlheinz"
Now showing items 1-20 of 21
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A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
A compact MOSFET breakdown model for optimization of gate coupled ESD protection circuits
Vassilev, Vesselin; Groeseneken, Guido; Bock, Karlheinz; Maes, Herman (1999) -
Characterisation of reliability of compound semiconductor devices using electrical pulses
Brandt, M.; Krozer, V.; Schuessler, M.; Bock, Karlheinz; Hartnagel, H. L. (1996) -
Coulomb-blockade in quantum dot-like GaAs field emission tips
Bock, Karlheinz (1996) -
ESD issues in compound semiconductor high frequency devices and circuits
Bock, Karlheinz (1997) -
ESD issues in compound semiconductor high-frequency devices and circuits
Bock, Karlheinz (1998) -
ESD protection methodology for deep-submicron CMOS
Bock, Karlheinz; Groeseneken, Guido; Maes, Herman (1998) -
ESD protection methodology for deep-submicron CMOS
Bock, Karlheinz; Groeseneken, Guido; Maes, Herman (1998) -
Influence of device geometry on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD-performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (2001) -
Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology
Bock, Karlheinz; Russ, Christian; Badenes, Gonçal; Groeseneken, Guido; Deferm, Ludo (1997) -
Investigation into socketed CDM (SDM) tester parasitics
Chaine, M.; Verhaege, K.; Avery, L.; Kelly, M.; Gieser, H.; Bock, Karlheinz; Henry, L. G.; Meuse, T.; Brodbeck, T.; Barth, J. (1999) -
Non-uniform triggering of gg-n MOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1998) -
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1999) -
Process and device design influence on the ESD performance of a fully silicided 0.25mm CMOS technology
Bock, Karlheinz; Russ, Christian; Badenes, Gonçal; Groeseneken, Guido; Deferm, Ludo (1997) -
Pulsed stress reliability investigations of Schottky diodes and HBTs
Schuessler, M.; Krozer, V.; Bock, Karlheinz; Hartnagel, H. L. (1996) -
Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Groeseneken, Guido; Maes, Herman (1996) -
Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Chen, Jian; Bock, Karlheinz; Maes, Herman (1999)