Browsing by author "Habas, Predrag"
Now showing items 1-10 of 10
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A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido (1995) -
Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo (1995) -
Analysis of charge pumping characteristics of single interface traps
Habas, Predrag; De Wolf, Ingrid; Groeseneken, Guido; Stesmans, Andre; Maes, Herman (1997) -
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido; Van den bosch, G.; Deferm, Ludo (1995) -
Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters
Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert; Maes, Herman; Gornik, E. (1997) -
Geometric current component in charge-pumping measurements
Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert (1997) -
Optical testing of submicron-technology MOSFETs and bipolar transistors
Pogany, D.; Fürböck, C.; Seliger, N.; Habas, Predrag; Gornik, E.; Kubicek, Stefan; Decoutere, Stefaan (1997) -
Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Bellens, Rudi; Van den Bosch, Geert; Habas, Predrag; Mieville, Jean-Paul; Badenes, Gonçal; Clerix, Andre; Groeseneken, Guido; Deferm, Ludo; Maes, Herman (1996) -
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G. (1995)