Browsing by author "Lauwaert, Johan"
Now showing items 1-20 of 27
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Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy
Simoen, Eddy; Dhayalan, Sathish Kumar; Hikavyy, Andriy; Loo, Roger; Rosseel, Erik; Vrielinck, Henk; Lauwaert, Johan (2017) -
Deep level transient spectroscopy (DLTS) study of P3HT:PCBM organic solar cells
Lauwaert, Johan; Khelifi, Samira; Decock, Koen; Burgelman, Marc; Voroshazi, Eszter; Aernouts, Tom; Spoltore, D.; Piersimoni, F.; Callens, Freddy; Vrielinck, Henk (2011) -
Deep-level transient spectroscopic study of quenched-in defects in germanium
Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Callens, Freddy; Vanhellemont, Jan; Simoen, Eddy; Vrielinck, Henk (2014) -
Density and capture cross-section of interface traps in GeSnO2 and GeO2 grown on hetero-epitaxial GeSn
Gupta, Somya; Simoen, Eddy; Loo, Roger; Madia, Oreste; Lin, Dennis; Merckling, Clement; Shimura, Yosuke; Conard, Thierry; Lauwaert, Johan; Vrielinck, Henk; Heyns, Marc (2016-05) -
Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge
Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Simoen, Eddy; Vanhellemont, Jan; Callens, Freddy; Vrielinck, Henk (2014) -
Electrical characterization of P3HT:PCM organic solar cells by temperature dependent admittance spectroscopy: defect investigation
Khelifi, Samira; Decock, Koen; Lauwaert, Johan; Voroshazi, Eszter; Aernouts, Tom; Vrielinck, Henk; Belghachi, Abderrahmane; Burgelman, Marc (2011) -
Electron irradiation induced defects in germanium-doped Czochralski silicon substrates and diodes
Chen, Jiahe; Vanhellemont, Jan; Simoen, Eddy; Lauwaert, Johan; Vrielinck, Henk; Rafi, Joan Marc; Ohyama, Hidenori; Weber, Jorg; Yang, Deren (2011) -
Electronic properties of manganese in germanium
Lauwaert, Johan; Segers, Siegfried; Moens, Filip; Opsomer, Karl; Clauws, Paul; Callens, Freddy; Simoen, Eddy; Vrielinck, Henk (2015) -
Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra
Gupta, Somya; Simoen, Eddy; Loo, Roger; Smets, Quentin; Verhulst, Anne; Lauwaert, Johan; Vrielinck, Henk; Heyns, Marc (2018) -
Impact of Ge doping on Si substrate and diode characteristics
Vanhellemont, Jan; Lauwaert, Johan; Chen, Jiiahe; Vrielinck, Henk; Rafi, Joan Marc; Ohyama, Hidenori; Simoen, Eddy; Yang, Deren (2010) -
Investigation of defects in P3HT:PCBM organic solar cells aged under constant illumination
Khelifi, Samira; Spoltore, D.; Piersimoni, Fortuntato; Voroshazi, Eszter; Decock, K; Lauwaert, Johan; Aernouts, Tom; Vrielinck, H; Manca, Jean; Burgelman, M. (2011) -
Investigation of recombination mechanisms in Cu(In,Ga)Se-2 solar cells using numerical modelling
Yang, Sheng; Khelifi, Samira; de Wild, Jessica; Vermang, Bart; Lauwaert, Johan (2021) -
Mn related defect levels in germanium
Lauwaert, Johan; Moens, Filip; Segers, Siegfried; Opsomer, Karl; Simoen, Eddy; Vanhellemont, Jan; Clauws, Paul; Callens, Freddy; Vrielinck, Henk (2014) -
Modeling Gate Leakage Current for p-GaN Gate HEMTs With Engineered Doping Profile
Alaei, Mojtaba; Borga, Matteo; Fabris, Elena; Decoutere, Stefaan; Lauwaert, Johan; Bakeroot, Benoit (2024) -
Numerical device modeling for direct Z-scheme junctions using a solar cell simulator
Jacob, Nithin Thomas; Lauwaert, Jeroen; Vermang, Bart; Lauwaert, Johan (2023) -
Numerical modelling of the performance-limiting factors in CZGse solar cells
Yang, Sheng; Khelifi, Samira; Brammertz, Guy; Choubrac, Leo; Barreau, Nicolas; Bolt, Pieter; Vermang, Bart; Lauwaert, Johan (2020) -
Porous multi-junction thin-film silicon solar cells for scalable solar water splitting
Trompoukis, Christos; Abbasi, Amin; Schuttauf, Jan-Willem; Bosserez, Tom; Ronge, Jan; Lauwaert, Johan; Martens, J.A.; Baets, Roel (2018-03) -
Profiling of border traps at GeSn and high-K oxide interface
Gupta, Somya; Simoen, Eddy; Dobri, Adam; Vrielinck, Henk; Lauwaert, Johan; Merckling, Clement; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Heyns, Marc (2014) -
Profiling of border traps at GeSn and high-K oxide interface
Gupta, Somya; Simoen, Eddy; Dobri, Adam; Vrielinck, Henk; Lauwaert, Johan; Merckling, Clement; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Heyns, Marc (2014-10) -
Study of electrically active defects in epitaxial layers on silicon
Simoen, Eddy; Dhayalan, Sathish Kumar; Jayachandran, Suseendran; Gupta, Somya; Gencarelli, Federica; Hikavyy, Andriy; Loo, Roger; Rosseel, Erik; Delabie, Annelies; Caymax, Matty; Langer, Robert; Barla, Kathy; Vrielinck, Henk; Lauwaert, Johan (2016)