Browsing by author "Nigam, Tanya"
Now showing items 1-20 of 39
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A fast and simple methodology for lifetime prediction of ultra-thin oxides
Nigam, Tanya; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (1999) -
Advanced cleaning and ultra-thin oxide technology
Heyns, Marc; Cornelissen, Ingrid; De Gendt, Stefan; Degraeve, Robin; Knotter, D. M.; Mertens, Paul; Mertens, S.; Meuris, Marc; Nigam, Tanya; Rotondaro, Antonio; Schaekers, Marc; Teerlinck, Ivo; Vos, Rita; Wolke, K. (1998) -
An inelastic quantum tunnelling model for current conduction after soft-breakdown
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Houssa, Michel; Vandewalle, N.; Nigam, Tanya; Ausloos, M.; Mertens, Paul; Heyns, Marc (1998) -
Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown
Crupi, Felice; Degraeve, Robin; Groeseneken, Guido; Nigam, Tanya; Maes, Herman (1998) -
Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry
Monaghan, M. L.; Nigam, Tanya; Houssa, Michel; De Gendt, Stefan; Urbach, H. P.; De Bokx, P. K. (2000) -
Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures
Nigam, Tanya; Degraeve, Robin; Groeseneken, Guido; Heyns, Marc; Maes, Herman (1998) -
Cost-effective cleaning and high-quality thin gate oxides
Heyns, Marc; Bearda, Twan; Cornelissen, Ingrid; De Gendt, Stefan; Degraeve, Robin; Groeseneken, Guido; Kenens, Conny; Knotter, D. M.; Loewenstein, Lee; Mertens, Paul; Mertens, S.; Meuris, Marc; Nigam, Tanya; Schaekers, Marc; Teerlinck, Ivo; Vandervorst, Wilfried; Vos, Rita; Wolke, K. (1999) -
Critical processes for ultra-thin gate oxide integrity
Depas, Michel; Heyns, Marc; Nigam, Tanya; Kenis, Karine; Sprey, Hessel; Wilhelm, H.; Wilhelm, Rudi; Crossley, A.; Sofield, C. J.; Gräf, D. (1996) -
Definition of dielectric breakdown for ultra thin (<2nm) gate oxides
Depas, Michel; Nigam, Tanya; Heyns, Marc (1997) -
Effect of extreme surface roughness on the electrical characteristics of ultra-thin gate oxides
Houssa, Michel; Nigam, Tanya; Mertens, Paul; Heyns, Marc (1999) -
Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides
Houssa, Michel; Nigam, Tanya; Mertens, Paul; Heyns, Marc (1998) -
Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides
Houssa, Michel; Nigam, Tanya; Mertens, Paul; Heyns, Marc (1999) -
Gate voltage dependence of reliability for ultra-thin oxides
Nigam, Tanya; Depas, Michel; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido (1997) -
Growth and reliability of 3nm N2O gate oxide
Nigam, Tanya; Depas, Michel; Heyns, Marc (1996) -
Growth Kinetics, Electrical Characterization and Reliability Study of sub-5 nm Gate Dielectrics
Nigam, Tanya (1999-05) -
Hot carrier degradation and time-dependent dielectric breakdown in oxides
Groeseneken, Guido; Degraeve, Robin; Nigam, Tanya; Van den bosch, G.; Maes, Herman (1999) -
Influence of Boron diffusion on reliability of ultra-thin oxides
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman (1998) -
Influence of boron diffusion on ultra-thin oxides
Nigam, Tanya; Depas, Michel; Heyns, Marc; Sofield, C. F.; Mapeldoram, L. (1997) -
Investigation and comparison of the noise in the gate and substrate current after soft-breakdown
Crupi, Felice; Degraeve, Robin; Groeseneken, Guido; Nigam, Tanya; Maes, Herman (1999)