Browsing by author "Ohyama, Hidenori"
Now showing items 1-20 of 122
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20-MeV alpha ray effects in AlGaAsP p-HEMTs
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kobayashi, K.; Yoneoka, M.; Nakabayashi, M.; Hakata, T.; Takizawa, H. (2000) -
Assessment of radiation induced lattice damage in shallow trench isolation diodes irradiated by neutrons
Kobayashi, K.; Ohyama, Hidenori; Hayama, Kiyoteru; Takami, Y.; Simoen, Eddy; Poyai, Amporn; Claeys, C. (2000) -
Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes
Simoen, Eddy; Claeys, Cor; Gaubas, Eugenijus; Ohyama, Hidenori (1998) -
Defect assessment of irradiated STI diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2001) -
Defect assessment of irradiated STI Diodes
Ohyama, Hidenori; Hayama, Kiyoteru; Miura, T.; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Nakabayashi, M.; Kobayashi, K. (2002) -
Degradation and recovery of 1.3μm InGaAsP laser diodes irradiated by 1-MeV fast neutrons
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kudou, T.; Yoneoka, M.; Sunaga, H. (1999) -
Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle
Ohyama, Hidenori; Simoen, Eddy; Kuroda, S.; Claeys, C.; Takami, Y.; Hakata, T.; Kobayashi, K.; Nakabayashi, M.; Sunaga, H. (2001) -
Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX
Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Takami, Y.; Kawamura, K.; Hakata, T.; Sunaga, H.; Ogita, Y. (1997) -
Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Hakata, T.; Kohiki, S.; Sunaga, H. (1996) -
Degradation and recovery of proton irradiated Si1-xGe x epitaxial devices
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996) -
Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles
Ohyama, Hidenori; Hakata, T.; Simoen, Eddy; Claeys, C.; Sunaga, H.; Hososhima, M. (1998) -
Degradation and recovery of Si1-xGex devices after proton irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1996) -
Degradation and recovery of Si1-xGex devices by irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudo, T.; Hakata, T.; Kobayashi, K.; Sunaga, H.; Hironaka, I.; Poortmans, Jef; Caymax, Matty (1995) -
Degradation of InGaAs pin photodiodes by neutron irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Kohiki, S.; Sunaga, H.; Hakata, T. (1996) -
Degradation of MOSFETs on SIMOX by irradiation
Hakata, T.; Ohyama, Hidenori; Simoen, Eddy; Claeys, C.; Vanhellemont, Jan; Takami, Y.; Sunaga, H.; Ogita, Y. (1997) -
Degradation of MOSFETs on SIMOX by irradiation
Hakata, T.; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Miyahara, K.; Kawamura, K.; Ogita, Y.; Takami, Y. (1999) -
Degradation of Si1-xGex epitaxial heterojunction bipolar transistors by 1-MeV fast neutrons
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Poortmans, Jef; Caymax, Matty (1995) -
Degradation of Si1-xGex epitxial devices by proton irradiation
Ohyama, Hidenori; Hayama, Kiyoteru; Vanhellemont, Jan; Poortmans, Jef; Caymax, Matty; Takami, Y.; Sunaga, H.; Nashiyama, I.; Uwatoko, Y. (1996) -
Degradation of SiGe devices by proton irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Sunaga, H.; Nahsiyama, I.; Owatoko, Y.; Poortmans, Jef; Caymax, Matty (1997) -
Degradation of SiGe devices by proton irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Sunaga, H.; Nashiyama, I.; Uwatoko, Y.; Poortmans, Jef; Caymax, Matty (1997)