Browsing by author "Wang, Wei-E"
Now showing items 41-56 of 56
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In-Situ HCl etching of InP in shallow-trench-isolated structures
Orzali, Tommaso; Wang, G.; Waldron, Niamh; Merckling, Clement; Richard, Olivier; Bender, Hugo; Wang, Wei-E; Caymax, Matty (2012) -
Influence of interface traps on high-mobility channel performance
Hellings, Geert; Eneman, Geert; Brammertz, Guy; Martens, Koen; Mitard, Jerome; Wang, Wei-E; Hoffmann, Thomas Y.; Meuris, Marc; De Meyer, Kristin (2010) -
Interfaces of high-k dielectrics on GaAs: their common features and the relationship with Fermi level pinning
Caymax, Matty; Brammertz, Guy; Delabie, Annelies; Sioncke, Sonja; Lin, Dennis; Scarrozza, Marco; Pourtois, Geoffrey; Wang, Wei-E; Meuris, Marc; Heyns, Marc (2009) -
Inversion behavior on n and p type ALD - Al2O3/In0.53Ga0.47As MOS capacitors
Lin, Dennis; Wang, Wei-E; Brammertz, Guy; Meuris, Marc; Heyns, Marc (2008) -
On the origin of mobility reduction in ultrathin EOT HK/MG CMOS devices: Impact from gate-stack and device architecture
Ragnarsson, Lars-Ake; Mitard, Jerome; Hong, Sug-Hun; Takeoka, Shinji; Tseng, Joshua; Wang, Wei-E; Yamaguchi, Shinpei; Trojman, Lionel; Kauerauf, Thomas; De Keersgieter, An; Schram, Tom; Rohr, Erika; Collaert, Nadine; Jurczak, Gosia; Bourdelle, Konstantin; Nguyen, B-Y; Absil, Philippe; Hoffmann, Thomas Y. (2011) -
On the origin of the mobility reduction in bulk-Si, UTBOX-FDSOI and SiGe devices with ultrathin-EOT dielectrics
Ragnarsson, Lars-Ake; Mitard, Jerome; Kauerauf, Thomas; De Keersgieter, An; Schram, Tom; Rohr, Erika; Collaert, Nadine; Jurczak, Gosia; Hong, Sug-Hun; Tseng, Joshua; Wang, Wei-E; Trojman, Lionel; Bourdelle, Konstantin; Nguyen, B-Y; Absil, Philippe; Hoffmann, Thomas Y. (2011) -
Optical detection and characterization of graphene by broadband spectrophotometry
Gray, Alexander; Baloogh, Mehdi; Allegret, Stephane; De Gendt, Stefan; Wang, Wei-E (2008) -
Oxide trapping in InGaAs-Al2O3 system and the role of sulfur in reducing the Al2O3 trap density
Alian, AliReza; Brammertz, Guy; Degraeve, Robin; Cho, Moon Ju; Merckling, Clement; Lin, Dennis; Wang, Wei-E; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2012) -
Passivation of InGaAs surface by ammonium sulfide vapor treatment
Alian, AliReza; Brammertz, Guy; Merckling, Clement; Firrincieli, Andrea; Wang, Wei-E; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2011) -
Scaling of nanoelectronics beyond the Si roadmap
Heyns, Marc; Bellenger, Florence; Brammertz, Guy; Cantoro, Mirco; Caymax, Matty; De Gendt, Stefan; De Jaeger, Brice; Delabie, Annelies; Eneman, Geert; Groeseneken, Guido; Houssa, Michel; Iacopi, Francesca; Leonelli, Daniele; Lin, Dennis; Magnus, Wim; Martens, Koen; Merckling, Clement; Meuris, Marc; Mitard, Jerome; Penaud, Julien; Pourtois, Geoffrey; Scarrozza, Marco; Simoen, Eddy; Sioncke, Sonja; Soree, Bart; Van Elshocht, Sven; Vandenberghe, William; Vandooren, Anne; Verhulst, Anne; Wang, Wei-E (2009) -
Selective area growth of high quality InP on Si (001) substrates
Wang, Gang; Leys, Maarten; Loo, Roger; Richard, Olivier; Bender, Hugo; Waldron, Niamh; Brammertz, Guy; Dekoster, Johan; Wang, Wei-E; Seefeldt, Marc; Caymax, Matty; Heyns, Marc (2010-09) -
Selective area growth of InP and defect elimination on Si (001) substrates
Wang, Gang; Leys, Maarten; Loo, Roger; Richard, Olivier; Bender, Hugo; Brammertz, Guy; Waldron, Niamh; Wang, Wei-E; Dekoster, Johan; Caymax, Matty; Seefeldt, Marc; Heyns, Marc (2011) -
Shaping the future of nanoelectronics beyond the Si roadmap with new materials and devices
Heyns, Marc; Bellenger, Florence; Brammertz, Guy; Caymax, Matty; Cantoro, Mirco; De Gendt, Stefan; De Jaeger, Brice; Delabie, Annelies; Eneman, Geert; Groeseneken, Guido; Hellings, Geert; Houssa, Michel; Iacopi, Francesca; Leonelli, Daniele; Lin, Dennis; Magnus, Wim; Martens, Koen; Merckling, Clement; Meuris, Marc; Mitard, Jerome; Penaud, Julien; Pourtois, Geoffrey; Scarrozza, Marco; Simoen, Eddy; Soree, Bart; Van Elshocht, Sven; Vandenberghe, William; Vandooren, Anne; Vereecken, Philippe; Verhulst, Anne; Wang, Wei-E (2010) -
Silicon and selenium implantation and activation in In0.53Ga0.47As under low thermal budget conditions
Alian, AliReza; Brammertz, Guy; Waldron, Niamh; Merckling, Clement; Hellings, Geert; Lin, Dennis; Wang, Wei-E; Meuris, Marc; Simoen, Eddy; De Meyer, Kristin; Heyns, Marc (2011) -
Superior NBTI reliability of SiGe channel pMOSFETs: replacement Gate, FinFETs, and impact of body bias
Franco, Jacopo; Kaczer, Ben; Eneman, Geert; Roussel, Philippe; Grasser, T.; Mitard, Jerome; Ragnarsson, Lars-Ake; Cho, Moon Ju; Witters, Liesbeth; Chiarella, Thomas; Togo, Mitsuhiro; Wang, Wei-E; Hikavyy, Andriy; Loo, Roger; Horiguchi, Naoto; Groeseneken, Guido (2011) -
The Fermi-level efficiency method and its applications on high interface trap density oxide-semiconductor interfaces
Lin, Dennis; Brammertz, Guy; Martens, Koen; De Valicourt, Guilhem; Negre, Laurent; Wang, Wei-E; Tsai, Wilman; Meuris, Marc; Heyns, Marc (2009)