Browsing by author "Smolanka, A."
Now showing items 1-17 of 17
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Back-gate induced noise overshoot in partially-depleted SOI MOSFETs
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2005) -
Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2007) -
Black-gate induced noise overshoot in partially-depleted SOI MOSFETs
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2004) -
Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs
Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Gabar, N.; Smolanka, A. (2005) -
Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2004) -
Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2004) -
Influence of the accumulation back-gate voltage on the noise spectra of deep submicron SOI MOSFET's in a wide range of drain voltages
Kudina, V.; Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2008) -
Investigation of tri-gate FinFETs by noise methods
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2011) -
Linear kink effect Lorentzians in the noise spectra of n- and p-channel fin field-effect transistors processed in standard and strained silicon-on-insulator substrates
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Claeys, Cor; Simoen, Eddy (2009) -
Linear-kink-noise suppression in partially depleted SOI using the twin-gate MOSFET configuration
Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Garbar, N.; Smolanka, A. (2005) -
LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2011) -
Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Lee, Shih Chung; Simoen, Eddy; Claeys, Cor (2005) -
Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2008) -
Low-frequency noise of strained and non-strained n-channel tri-gate FinFETs with different gate dielectrics
Lukynachikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2009) -
On the 1/f noise of triple-gate field-effect transistors with high-k gate dielectric
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Put, Sofie; Claeys, Cor; Simoen, Eddy (2009) -
Origin of the front-back gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Simoen, Eddy; Claeys, Cor (2005) -
Short-channel effects in the Lorentzian noise induced by the EVB tunneling in partially depleted SOI MOSFETs
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2004)