Browsing by author "Wu, Tian-Li"
Now showing items 21-40 of 47
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Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Wu, Cheng-Hung; Ronchi, Nicolo; Wang, Kuan-Chi; Wang, Yu-Yun; Mcmitchell, Sean; Banerjee, Kaustuv; van den Bosch, Geert; van Houdt, Jan; Wu, Tian-Li (2022) -
Investigation of constant voltage off-state stress on Au-free AlGaN/GaN Schottky barrier diodes
Hu, Jie; Stoffels, Steve; Lenci, Silvia; Wu, Tian-Li; Ronchi, Nicolo; You, Shuzhen; Bakeroot, Benoit; Groeseneken, Guido; Decoutere, Stefaan (2015) -
Investigation of the impact of hot electrons and high drain bias on the dynamic Ron increase in GaN-based MIS-HEMTs grown on silicon
Meneghini, Matteo; Bisi, Davide; Stoffels, Steve; Marcon, Denis; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico (2014) -
Lifetime investigation of Si3N4/Al2O3 as gate dielectric for AlGaN/GaN MIS-HEMTs studied with Time Dependent Dielectric Breakdown
Zahid, Mohammed; Marcon, Denis; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan (2012) -
Long term stability of enhancement mode GaN power devices
Wu, Tian-Li (2016-08) -
Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs
Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Ruzzarin, Maria; Van Hove, Marleen; Stoffels, Steve; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico (2016) -
Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation
Meneghesso, Gaudenzio; Meneghini, Matteo; Rossetto, Isabella; Rizzato, Vanessa; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; You, Shuzhen; Posthuma, Niels; Decoutere, Stefaan; Zanoni, Enrico (2016) -
On the origin of the two-dimensional electron gas at AlGaN/GaN at AlGaN/GaN heterojunctions and its influence on gate-recessed MISHEMTs - A TCAD study
Bakeroot, Benoit; You, Shuzhen; Wu, Tian-Li; Hu, Jie; Van Hove, Marleen; De Jaeger, Brice; Geens, Karen; Stoffels, Steve; Decoutere, Stefaan (2014) -
ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs
Wu, Wei-Min; Chen, Shih-Hung; Shih, Chun-An; Parvais, Bertrand; Collaert, Nadine; Ker, Ming-Dou; Wu, Tian-Li; Groeseneken, Guido (2023) -
Optimization of the source field-plate design for low dynamic Rds-on dispersion of AlGaN/GaN MIS-HEMTs
Ronchi, Nicolo; Bakeroot, Benoit; You, Shuzhen; Hu, Jie; Stoffels, Steve; De Jaeger, Brice; Decoutere, Stefaan; Wu, Tian-Li (2017) -
Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
Wu, Tian-Li; Franco, Jacopo; Marcon, Denis; De Jaeger, Brice; Bakeroot, Benoit; Kang, Xuanwu; Stoffels, Steve; Van Hove, Marleen; Groeseneken, Guido; Decoutere, Stefaan (2016) -
Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants
Wang, Yu-Yun; Wang, Kuan-Chi; Chang, Ting -Yu; Ronchi, Nicolo; O'Sullivan, Barry; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Wu, Tian-Li (2022) -
Reliability analysis of permanent degradations on AlGaN/GaN HEMTs
Marcon, Denis; Meneghesso, Gaudenzio; Wu, Tian-Li; Stoffels, Steve; Meneghini, Matteo; Zanoni, Enrico; Decoutere, Stefaan (2013) -
Ron collapse, breakdown and degradation of d-mode MIS-HEMTs based on GaN on Si technology
Meneghini, Matteo; Bisi, Davide; Marcon, Denis; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico (2013) -
Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress
Wu, Tian-Li; Marcon, Denis; Stoffels, Steve; You, Shuzhen; De Jaeger, Brice; Van Hove, Marleen; Groeseneken, Guido; Decoutere, Stefaan (2014) -
Stability of Schottky Barrier Diode Integrated in p-GaN Enhancement-mode GaN Power Technology
Gallardo, Jethro Oroceo; De Jaeger, Brice; Dash, Sachidananda; Tang, Shun-Wei; Tran, Thanh Nga; Wellekens, Dirk; Bakeroot, Benoit; Decoutere, Stefaan; Wu, Tian-Li (2021) -
Study of constant voltage off-state stress on Au-free AlGaN/GaN Schottky barrier diodes
Hu, Jie; Stoffels, Steve; Lenci, Silvia; Wu, Tian-Li; Ronchi, Nicolo; You, Shuzhen; Bakeroot, Benoit; Groeseneken, Guido; Decoutere, Stefaan (2014) -
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis
Rossetto, Isabella; Meneghini, Matteo; Rizzato, Vanessa; Ruzzarin, Maria; Favaron, Andrea; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico (2016) -
The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate
Wu, Tian-Li; Marcon, Denis; De Jaeger, Brice; Van Hove, Marleen; Bakeroot, Benoit; Lin, Dennis; Stoffels, Steve; Kang, Xuanwu; Roelofs, Robin; Groeseneken, Guido; Decoutere, Stefaan (2015) -
Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics of AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs
Wu, Tian-Li; Marcon, Denis; De Jaeger, Brice; Van Hove, Marleen; Bakeroot, Benoit; Stoffels, Steve; Groeseneken, Guido; Decoutere, Stefaan; Roelofs, Robin (2015)