Browsing by author "Ohyama, H."
Now showing items 21-40 of 92
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Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Matsuyama, K.; Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Hayama, K.; Rafi, J.M.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Kuboyama, S.; Oka, K.; Matsuda, S. (2004) -
Device performance of 90nm nMOSFETs at liquid nitrogen temperature
Takakura, K.; Hayama, K.; Ohyama, H.; Mercha, Abdelkarim; Lee, Shih-Chung; Simoen, Eddy; Claeys, Cor (2004) -
Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation
Hayama, K.; Takakura, K.; Ohyama, H.; Kuboyama, S.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2007) -
Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2004) -
Effect of gate interface on performance degration of irradiated SiC-MESFET
Ohyama, H.; Takakura, K.; Yoneoka, M.; Uemura, K.; Motoki, M.; Matsuo, K.; Arai, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2007) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Hayama, K.; Ohyama, H.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2004) -
Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Ohyama, H.; Hayama, K.; Takakura, K.; Jono, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of electron and proton radiation on embedded SiGe source/drain diodes
Ohyama, H.; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, M.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2008) -
Effects of electron irradiation on IGBT devices
Ohyama, H.; Takakura, K.; Nakabayashi, M.; Hirao, T.; Onoda, S.; Kamiya, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of electron irradiation on SiC Schottky diodes
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Nakabayashi, M.; David, Marie-Laure; Simoen, Eddy; Claeys, Cor (2004) -
Effects of high temperature electron irradiation on trench-IGBT
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Simoen, Eddy; Claeys, Cor; Takakura, K.; Iwata, T.; Kudou, T.; Yoneaka, M. (2005) -
Effects of high-temperature electron irradiation on submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2002) -
Effects of irradiation induced lattice defects on standard trench and fine pattern trench IGBT characteristics
Nakabayashi, M.; Ohyama, H.; Kaneko, T.; Hanano, K.; Rafi, J.M.; Simoen, Eddy; Claeys, Cor (2009) -
Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2002)