Browsing by author "Badenes, Gonçal"
Now showing items 21-40 of 75
-
Elevated co-silicide for sub-100nm high performance and RF CMOS
Jurczak, Gosia; de Potter de ten Broeck, Muriel; Rooyackers, Rita; Jeamsaksiri, Wutthinan; Redolfi, Augusto; Grau, Lluis; Lauwers, Anne; Lindsay, Richard; Peytier, Ivan; Augendre, Emmanuel; Badenes, Gonçal (2002) -
Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: process window versus complexity
Augendre, Emmanuel; Rooyackers, Rita; Caymax, Matty; Vandamme, Ewout; De Keersgieter, An; Perello, Carles; Van Dievel, Marc; Pochet, Sandrine; Badenes, Gonçal (2000) -
Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements
Schreurs, Dominique; Vandenberghe, S.; Carchon, Geert; Nauwelaers, Bart; Vandamme, Ewout; Badenes, Gonçal; Deferm, Ludo (2000) -
Evidence for short-channel effect in the radiation response of 0.18μm CMOS transistors
Simoen, Eddy; Hermans, Jan; Augendre, Emmanuel; Marescaux, Théodore; Claeys, Cor; Badenes, Gonçal; Mohammadzadeh, A. (2000) -
Gate dielectrics for high performance and low power CMOS SoC applications
Cubaynes, Florence; Dachs, Charles; Detcheverry, Celine; Zegers, A.; Venezia, Vincent; Schmitz, Jurriaan; Stolk, Peter; Jurczak, Gosia; Henson, Kirklen; Degraeve, Robin; Rothschild, Aude; Conard, Thierry; Pétry, Jasmine; Da Rold, Martina; Schaekers, Marc; Badenes, Gonçal; Date, L.; Pique, D.; Al-Shareef, H.; Murto, R. (2002) -
Gate stack optimisation for advanced CMOS process
Kubicek, Stefan; Vandenberghe, Geert; Schaekers, Marc; Kol'dyaev, Victor; Jansen, Philippe; Badenes, Gonçal; Deferm, Ludo; De Meyer, Kristin; Kerr, Daniel; Naem, Abdalla (1999) -
Gate-source-drain architecture impact on DC and performance of sub-100-nm elevated source/drain NMOS transistors
Jeamsaksiri, Wutthinan; Jurczak, Gosia; Grau, Lluis; Linten, Dimitri; Augendre, Emmanuel; de Potter de ten Broeck, Muriel; Rooyackers, Rita; Wambacq, Piet; Badenes, Gonçal (2003) -
Halo doping for good performance and reliability in 0.25μm CMOS technology
Hendriks, Marton; Badenes, Gonçal; Deferm, Ludo (1996) -
Impact of gate oxide nitridation process on 1/f noise in 0.18 micron CMOS
Da Rold, Martina; Simoen, Eddy; Mertens, S.; Schaekers, Marc; Badenes, Gonçal; Decoutere, Stefaan (2001) -
Impact of MOSFET oxide breakdown on digital circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; Groeseneken, Guido; Rasras, Mahmoud; Kubicek, Stefan; Vandamme, Ewout; Badenes, Gonçal (2000) -
Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS
Da Rold, Martina; Simoen, Eddy; Badenes, Gonçal; Decoutere, Stefaan (2000) -
Impact of non-quasi-static effects on the high-frequency small-signal behaviour of MOSFETs
Vandamme, Ewout; Badenes, Gonçal (2000) -
Impact of residual high-energy boron implantation induced p-well defects on shallow junctions
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Rooyackers, Rita; Badenes, Gonçal (2000) -
Influence of the height difference between the first and second nitride layer on erosion and dishing in the dual nitride approach for shallow trench isolation
Heylen, Nancy; Grillaert, Joost; Vrancken, Evi; Badenes, Gonçal; Rooyackers, Rita; Meuris, Marc; Heyns, Marc (1998) -
Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology
Bock, Karlheinz; Russ, Christian; Badenes, Gonçal; Groeseneken, Guido; Deferm, Ludo (1997) -
Integration challenges in sub-0.25μm CMOS-based technologies
Badenes, Gonçal; Deferm, Ludo (2000) -
Integration difficulties and limitations in sub-0.25μm CMOS-based technologies
Deferm, Ludo; Badenes, Gonçal (2000) -
Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures
Stuer, Cindy; Van Landuyt, J.; Bender, Hugo; De Wolf, Ingrid; Rooyackers, Rita; Badenes, Gonçal (2001) -
Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Kubicek, Stefan; Henson, W. K.; De Keersgieter, An; Badenes, Gonçal; Jansen, Philippe; van Meer, Hans; Kerr, Daniel; Naem, Abdalla; Deferm, Ludo; De Meyer, Kristin (1999) -
Investigation of stress in shallow trench isolation using UV micro-raman spectroscopy
Dombrowski, Kai; Dietrich, B.; De Wolf, Ingrid; Rooyackers, Rita; Badenes, Gonçal (2001)