Browsing by author "Rotondaro, Antonio"
Now showing items 21-37 of 37
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Outplating of metallic contaminants on silicon wafers from diluted acid solutions
Rotondaro, Antonio; Hurd, Trace; Schmidt, Harald; Teerlinck, Ivo; Heyns, Marc; Claeys, Cor (1995) -
Physico chemical aspects of hydrogen peroxide based silicon wafer cleaning solutions
Schmidt, Harald; Meuris, Marc; Mertens, Paul; Rotondaro, Antonio; Heyns, Marc; Hurd, Trace; Hatcher, Z. (1994) -
Protrusion formation at the edges of ion implanted regions
Rotondaro, Antonio; Bender, Hugo; Heyns, Marc; Claeys, Cor (1996) -
Recombination activity of iron related complexes in silicon
Kaniava, Arvydas; Gaubas, Eugenijus; Vaitkus, J.; Vanhellemont, Jan; Rotondaro, Antonio (1995) -
Recombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements
Kaniava, Arvydas; Rotondaro, Antonio; Vanhellemont, Jan; Menczigar, U.; Gaubas, Eugenijus (1995) -
Recombination activity of iron-related complexes in silicon studied with microwave and light-induced absorption techniques
Kaniava, Arvydas; Rotondaro, Antonio; Vanhellemont, Jan; Simoen, Eddy; Gaubas, Eugenijus; Vaitkus, J.; Hurd, Trace; Mertens, Paul; Claeys, Cor; Gräf, D. (1994) -
Sensitive light scattering as a semiquantitative method for studying photoresist stripping
Rotondaro, Antonio; Meuris, Marc; Schmidt, Harald; Heyns, Marc; Claeys, C.; Hellemans, L.; Snauwaert, L. (1995) -
Static and low-frequency noise characteristics of n+p junction diodes fabricated in different silicon substrates
Simoen, Eddy; Vanhellemont, Jan; Rotondaro, Antonio; Claeys, C. (1995) -
The IMEC Clean concept : an advanced wafer cleaning technology
Meuris, Marc; Verhaverbeke, Steven; Mertens, Paul; Schmidt, Harald; Rotondaro, Antonio; Heyns, Marc; Depas, Michel; Philipossian, A.; Vatel, Oliver (1994) -
The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
Rotondaro, Antonio; Vandamme, Ewout; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, C. (1996) -
The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Rotondaro, Antonio; Hurd, Trace; Kaniava, Arvydas; Vanhellemont, Jan; Simoen, Eddy; Heyns, Marc; Claeys, Cor; Brown, G. (1995) -
The importance of H2O2 decomposition in silicon surface cleaning
Schmidt, Harald; Meuris, Marc; Mertens, Paul; Rotondaro, Antonio; Heyns, Marc; Hurd, Trace; Hatcher, Z. (1994) -
The kink-related excess low-frequency noise in silicon-on-insulator MOST's
Simoen, Eddy; Magnusson, Ulf; Rotondaro, Antonio; Claeys, Cor (1994) -
The potential and restrictions of the double derivative method for threshold voltage extraction in SOI MOSFETs
Simoen, Eddy; Vandamme, Ewout; Rotondaro, Antonio; Claeys, Cor (1994) -
The relation between sodium and aluminum contamination and dielectric breakdown in MOS structures
Vermeire, Bert; Rotondaro, Antonio; Mertens, Paul; Verhaverbeke, Steven; Heyns, Marc (1994) -
Transient effects in accumulation mode p-channel SOI MOSFETs operating at 77K
Martino, Joao Antonio; Rotondaro, Antonio; Simoen, Eddy; Magnusson, Ulf; Claeys, Cor (1994) -
Ultra clean processing technology for highly reliable gate oxides
Heyns, Marc; Meuris, Marc; Mertens, Paul; Schmidt, Harald; Verhaverbeke, Steven; Bender, Hugo; Vandervorst, Wilfried; Caymax, Matty; Rotondaro, Antonio; Hatcher, Z.; Gräf, D. (1994)