Browsing by author "Ferain, Isabelle"
Now showing items 21-34 of 34
-
Mobility extraction using RFCV for 80nm MOSFET with 1nm EOT HfSiON/TiN
San Andres Serrano, Enrique; Pantisano, Luigi; Severi, Simone; Trojman, Lionel; Ferain, Isabelle; Toledano-Luque, M.; Jurczak, Gosia; Groeseneken, Guido; De Gendt, Stefan; Heyns, Marc (2007) -
Multi-gate devices for the 32nm technology node and beyond
Collaert, Nadine; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Lai, Li-Shyue; Lenoble, Damien; Mercha, Abdelkarim; Nackaerts, Axel; Pawlak, Bartek; Rooyackers, Rita; Schulz, Thomas; San, Kemal Tamer; Son, Nak Jin; Van Dal, Mark; Verheyen, Peter; von Arnim, Klaus; Witters, Liesbeth; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2007) -
Multi-gate devices for the 32nm technology node and beyond
Collaert, Nadine; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Lai, Li-Shyue; Lenoble, Damien; Mercha, Abdelkarim; Nackaerts, Axel; Pawlak, Bartek; Rooyackers, Rita; Schulz, Thomas; San, Kemal Tamer; Son, Nak Jin; Van Dal, Mark; Verheyen, Peter; von Arnim, Klaus; Witters, Liesbeth; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008) -
Multiple-Vt FinFET devices through La2O3 dielectric capping
Witters, Liesbeth; Veloso, Anabela; Ferain, Isabelle; Demand, Marc; Collaert, Nadine; Son, Nak Jin; Adelmann, Christoph; Meersschaut, Johan; Vos, Rita; Rohr, Erika; Wada, Masayuki; Schram, Tom; Kubicek, Stefan; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008) -
Novel, effective and cost-efficient method of introducing fluorine into metal/Hf-based gate stack in MuGFET and planar SOI devices with significant BTI improvement
Shickova, Adelina; Collaert, Nadine; Zimmerman, Paul; Demand, Marc; Simoen, Eddy; Pourtois, Geoffrey; De Keersgieter, An; Trojman, Lionel; Ferain, Isabelle; Leys, Frederik; Boullart, Werner; Franquet, Alexis; Kaczer, Ben; Jurczak, Gosia; Maes, Herman; Groeseneken, Guido (2007) -
Parasitic source/drain resistance reduction in N-channel SOI MuGFETs with 15nm wide fins
Dixit, Abhisek; Ferain, Isabelle; De Meyer, Kristin; Kottantharayil, Anil; Collaert, Nadine; Rooyackers, Rita; Leys, Frederik; De Keersgieter, An; Hoffmann, Thomas; Loo, Roger; Caymax, Matty; Jurczak, Gosia; Biesemans, Serge; Goodwin, Michael; Zimmerman, Paul (2005-10) -
Performance assessment of (110) p-FET high-k/MG: is it mobility or series resistance limited?
Trojman, Lionel; Pantisano, Luigi; Severi, Simone; San Andres Serrano, Enrique; Hoffmann, Thomas Y.; Ferain, Isabelle; De Gendt, Stefan; Heyns, Marc; Maes, Herman; Groeseneken, Guido (2007) -
Reduction of the anomalous VT behavior in MOSFETs with High-k/metal gate stacks
Ferain, Isabelle; Pantisano, Luigi; Kottantharayil, Anil; Petry, Jasmine; Trojman, Lionel; Collaert, Nadine; Jurczak, Gosia; De Meyer, Kristin (2007) -
Subthreshold channels at the edges of nanoscale triple-gate silicon transistors
Sellier, H.; Lansbergen, G.P.; Caro, J.; Rogge, Sven; Collaert, Nadine; Ferain, Isabelle; Jurczak, Gosia; Biesemans, Serge (2007) -
Tall triple-gate device with TiN/HfO2 gate stack
Collaert, Nadine; Demand, Marc; Ferain, Isabelle; Lisoni, Judit; Singanamalla, Raghunath; Zimmerman, Paul; Yim, Yong Sik; Schram, Tom; Mannaert, Geert; Goodwin, Michael; Hooker, Jacob; Neuilly, Francois; Kim, Myeong-Cheol; De Meyer, Kristin; De Gendt, Stefan; Boullart, Werner; Jurczak, Gosia; Biesemans, Serge (2005) -
The device architecture dilemma for CMOS technologies: opportunities & challenges of FinFET over planar MOSFET
Parvais, Bertrand; Mercha, Abdelkarim; Collaert, Nadine; Rooyackers, Rita; Ferain, Isabelle; Jurczak, Gosia; Subramanian, Vaidy; De Keersgieter, An; Chiarella, Thomas; Kerner, Christoph; Witters, Liesbeth; Biesemans, Serge; Hoffmann, Thomas Y. (2009) -
Trapping in 1nm EOT high-k / MG
Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; Aoulaiche, Marc; Trojman, Lionel; Ferain, Isabelle; san andres, e; Shickova, Adelina; O'Connor, Robert; Groeseneken, Guido; Heyns, Marc; De Gendt, Stefan (2008) -
Treshold voltage modulation in FINFET devices through arsenic ion implantation into TiN/HfSiON gate stack
Witters, Liesbeth; Son, Nak Jin; Ferain, Isabelle; San, Tamer; Singanamalla, Raghunath; Kerner, Christoph; Collaert, Nadine; De Meyer, Kristin; Jurczak, Gosia (2007-10) -
Velocity and mobility investigation in 1nm-EOT HfSiON on Si-(110) and (100) – does the dielectric quality matter?
Trojman, Lionel; Pantisano, Luigi; Dehan, Morin; Ferain, Isabelle; Severi, Simone; Maes, Herman; Groeseneken, Guido (2009)