Browsing by author "Takakura, K."
Now showing items 21-40 of 78
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Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2004) -
Effect of gate interface on performance degration of irradiated SiC-MESFET
Ohyama, H.; Takakura, K.; Yoneoka, M.; Uemura, K.; Motoki, M.; Matsuo, K.; Arai, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2007) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Hayama, K.; Ohyama, H.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2004) -
Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Ohyama, H.; Hayama, K.; Takakura, K.; Jono, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of electron and proton radiation on embedded SiGe source/drain diodes
Ohyama, H.; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, M.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2008) -
Effects of electron irradiation on IGBT devices
Ohyama, H.; Takakura, K.; Nakabayashi, M.; Hirao, T.; Onoda, S.; Kamiya, T.; Simoen, Eddy; Claeys, Cor (2003) -
Effects of electron irradiation on SiC Schottky diodes
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Nakabayashi, M.; David, Marie-Laure; Simoen, Eddy; Claeys, Cor (2004) -
Effects of electron irradiation on SiGe devices
Ohyama, Hidenori; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; Claeys, Cor (2010) -
Effects of high temperature electron irradiation on trench-IGBT
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Simoen, Eddy; Claeys, Cor; Takakura, K.; Iwata, T.; Kudou, T.; Yoneaka, M. (2005) -
Effects of high-temperature electron irradiation on submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2002) -
Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2002) -
Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
Takakura, K.; Aoki, Y.; Hayama, K.; Oyana, H.; Simoen, Eddy; Claeys, Cor (2007) -
Electron irradiation effect on thermal donors in CZ-Si
Takakura, K.; Ohyama, H.; Murakawa, H.; Yoshida, T.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2004) -
Electron irradiation effects on thermal donors in Cz-Si
Takakura, K.; Ohyama, Hidenori; Murakawa, H.; Yoshida, T.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Electron irradiation of IGBTs
Nakabayashi, M.; Iwata, T.; Ohyama, H.; Takakura, K.; Yoneoka, M.; Simoen, Eddy; Claeys, Cor (2004) -
Enhancement of "linear kink effect" in fully depleted SOI n-MOSFETs at liquid nitrogen temperature
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2004) -
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Ohyama, Hidenori; Naka, N.; Takakura, K.; Tsunoda, I.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2011) -
Evaluation of electron irradiated embedded SiGe source/drain diodes by Raman spectroscopy
Oyhama, Hidenori; Naka, N.; Takakura, K.; Tsunoda, I.; Londos, C.A; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010)