Browsing by author "Mahadeva Iyer, Natarajan"
Now showing items 21-40 of 40
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ESD reliability issues in RF CMOS circuits
Radhakrishnan, M. K.; Vassilev, Vesselin; Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido (2002) -
ESD reliability issues in sub-micron CMOS - trends and challenges
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; De Heyn, Vincent; Daenen, Tom; Groeseneken, Guido (2003) -
ESD-RF co-design methodology for the state of the art RF-CMOS blocks
Vassilev, Vesselin; Thijs, Steven; Segura, Pablo; Wambacq, Piet; Leroux, Paul; Mahadeva Iyer, Natarajan; Maes, Herman; Steyaert, Michiel (2005) -
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices
Vassilev, Vesselin; Jenei, Snezana; Groeseneken, Guido; Venegas, Rafael; Thijs, Steven; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Steyaert, M.; Maes, Herman (2003) -
Impact of CMOS Scaling and Technology Options on ESD Reliability
Mahadeva Iyer, Natarajan; Thijs, Steven; Vassilev, Vesselin; Tremouilles, David; Linten, Dimitri; Groeseneken, Guido (2005) -
Impact of elevated source drain architecture on ESD protection devices for a 90 nm CMOS technology node
Thijs, Steven; De Heyn, Vincent; Vassilev, Vesselin; Mahadeva Iyer, Natarajan; Linten, Dimitri; Jeamsaksiri, Wutthinan; Daenen, T.; Jurczak, Gosia; Rooyackers, Rita; Groeseneken, Guido (2003-09) -
Implementation of plug-and-play ESD protection in 5.5 GHz 90 nm RF CMOS LNAs - concepts, constraints and solutions
Thijs, Steven; Mahadeva Iyer, Natarajan; Linten, Dimitri; Jeamsaksiri, Wutthinan; Daenen, Tom; Degraeve, Robin; Scholten, Andries; Decoutere, Stefaan; Groeseneken, Guido (2005) -
Low-power low-noise highly ESD robust LNA and VCO design using above IC inductors
Linten, Dimitri; Sun, Xiao; Thijs, Steven; Mahadeva Iyer, Natarajan; Mercha, Abdelkarim; Carchon, Geert; Wambacq, Piet; Nakaie, T.; Decoutere, Stefaan (2005-09) -
Modeling and simulation for ESD protection circuit design and optimization
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; Groeseneken, Guido (2004-12) -
Multilevel transmission line pulse (MTLP) tester
Daenen, Tom; Thijs, Steven; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; De Heyn, Vincent; Groeseneken, Guido (2004) -
Physical failure analysis to distinguish EOS and ESD failures
Tung, Chih Hang; Cheng, Cheng Kou; Radhakrishnan, M.K.; Mahadeva Iyer, Natarajan (2002) -
RF ESD protection strategies - the design and performance trade-off challenges
Jansen, Philippe; Thijs, Steven; Linten, Dimitri; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Liu, Mingxu; Concannon, A.; Tremouilles, David; Nakaie, T.; Sawada, M.; Vashchenko, V.; ter Beek, M.; Hasebe, T.; Decoutere, Stefaan; Groeseneken, Guido (2005-09) -
RFCMOS ESD protection and reliability
Mahadeva Iyer, Natarajan; Linten, Dimitri; Thijs, Steven; Jansen, Philippe; Tremouilles, David; Decoutere, Stefaan; Groeseneken, Guido (2005-06) -
Significance of the failure criterion on transmission line pulse testing
Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2002) -
Snapback circuit model for cascaded NMOS ESD over-voltage protection structures
Vassilev, Vesselin; Lorenzini, Martino; Jansen, Philippe; Vashchenko, V.; Yang, J.J.; Concannon, A.; Archer, D.; Groeseneken, Guido; Mahadeva Iyer, Natarajan; Terbeek, M.; Thijs, Steven; Choi, B.J.; Steyaert, M.; Maes, Herman (2003-09) -
Standardization of the transmission line pulse testing methodology for electrostatic discharge
Voldman, Steven; Ashton, Robert; Barth, Jon; Maloney, Tim; Mahadeva Iyer, Natarajan; Worley, Eugene (2003-09) -
Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005) -
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, Wolfgang; Esmark, K.; Reynders, K.; Zuhbeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, S.; Settler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2003) -
Transient voltage overshoot in TLP testing - real or artifact
Tremouilles, David; Thijs, Steven; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Roussel, Philippe; Groeseneken, Guido (2005) -
Transient voltage overshoot in TLP testing - Real or artifact?
Tremouilles, David; Thijs, Steven; Roussel, Philippe; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2007)