Browsing by author "Simoen, Eddy"
Now showing items 41-60 of 1574
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A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K
Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1995) -
A new method to extract the LDD doping concentration on fully depleted SOI nMOSFETs at 300K
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2000) -
A new method to extract the silicon film thickness of enhancement mode fully depleted SOI nMOSFETs at 300K
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, C. (2000) -
A new technique to extract the oxide charge density at front and back interfaces of SOI NMOSFETs devices
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, C. (2001) -
A novel approach to analyse FTIR spectra of precipitates in moderately and heavily doped silicon
De Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; Van Landuyt, J.; Simoen, Eddy; Claeys, Cor (2003) -
A novel simple method to extract the effective LDD doping concentration on fully depleted SOI nMOSFET
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1999) -
A statistical approach to microdose induced degradation in FinFET devices
Griffoni, Alessio; Gerardin, S.; Roussel, Philippe; Degraeve, Robin; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2009) -
A study on radiation damage of IGBTs 2-MeV electrons at different temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Ohyama, H.; Claeys, Cor; Nakabayashi, H.; Masakazu, T.; Simoen, Eddy; Hanano, M.; Naotika, F.; Hirao, T. (2003) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2004) -
A study on the self-heating effect in deep submicrometer partially depleted SOI MOSFET at low temperature
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor; De Meyer, Kristin (2003) -
A two-dimensional model for interface coupling in triple-gate transistors
Akarvardar, Kerem; Mercha, Abdelkarim; Cristoloveanu, Sorin; Gentil, Pierre; Simoen, Eddy; Subramanian, Vaidy; Claeys, Cor (2007) -
A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
Decoutere, Stefaan; Simoen, Eddy; Vancuyck, Geert; Deferm, Ludo; Claeys, Cor (1997) -
Accurate extraction of the diffusion line current in silicon p-n junction diodes
Simoen, Eddy; Claeys, Cor; Czerwinski, A.; Katcki, J. (1998) -
Activation energy analysis as a tool for extraction and investigation of p-n junction leakage current components
Czerwinski, A.; Simoen, Eddy; Poyai, Amporn; Claeys, Cor (2003) -
Advanced semiconductor devices for future CMOS technologies
Claeys, Cor; Chiappe, Daniele; Collaert, Nadine; Mitard, Jerome; Radu, Iuliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron (2015) -
Advanced transistors for high frequency applications
Parvais, Bertrand; Peralagu, Uthayasankaran; Alian, AliReza; Vais, Abhitosh; Witters, Liesbeth; Mols, Yves; Walke, Amey; Ingels, Mark; Yu, Hao; Putcha, Vamsi; Khaled, Ahmad; Rodriguez, Raul; Sibaja-Hernandez, Arturo; Yadav, Sachin; ElKashlan, Rana Y.; Baryshnikova, Marina; Mannaert, Geert; Alcotte, Reynald; Simoen, Eddy; Zhao, Ming; zhao, ellen; De Jaeger, Brice; Fleetwood, D.M.; Langer, Robert; Wambacq, Piet; Kunert, Bernardette; Waldron, Niamh; Collaert, Nadine (2020) -
Advantages of different source/drain engineering on scaled UTBOX FD SOI nMOSFETs at high temperature operation
Nicoletti, Talitha; Dos Santos, Sara; Martino, Joao A.; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor (2014) -
Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Martin-Martinez, J.; Amat, E.; Ayala, N.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2011)