Browsing by title

Use of corona charge photo-conductance decay (charge-PCD) for fast metal contamination monitoring of high temperature processes

Huyghebaert, Cedric; Bearda, Twan; Rosseel, Erik; Everaert, Jean-Luc; Don, Eric; Pavelka, Tibor (2008)

Use of gettering and defect induced processes in ultra-thin buried oxide synthesis

Litovchenko, V. G.; Efremov, A. A.; Romanuk, B. N.; Mel'nik, V. P.; Claeys, Cor (1997)

Use of grazing emission XRF for silicon wafer surface contamination measurements

De Gendt, Stefan; Kenis, Karine; Mertens, Paul; Heyns, Marc; Claes, M.; Van Grieken, R. E.; Bailleul, A.; Knotter, Martin; De Bokx, P. K. (1996)

Use of high frequency electrorotation to identify cytoplasmic changes in cells non-disruptively

Dalben Madeira Campos, Camila; Uning, Kevin; Barmuta, Pawel; Markovic, Tomislav; Yadav, Rahul; Mangraviti, Giovanni; Ocket, Ilja; Van Roy, Wim; Lagae, Liesbet; Liu, Chengxun (2023)

Use of high order precursors for manufacturing gate all around devices

Hikavyy, Andriy; Mertens, Hans; Witters, Liesbeth; Loo, Roger; Horiguchi, Naoto (2016)

Use of high order precursors for manufacturing Gate all around devices

Hikavyy, Andriy; Zyulkov, Ivan; Mertens, Hans; Witters, Liesbeth; Loo, Roger; Horiguchi, Naoto (2017)

Use of indium and gallium as P-type dopants in Si 0.1 mm MOSFETs

Biesemans, Serge; Kubicek, Stefan; De Meyer, Kristin (1996)

Use of linear correlation coefficients in the analysis of carrier density imaging recombination lifetime maps

Cornagliotti, Emanuele; John, Joachim; Poortmans, Jef; Mertens, Robert (2010)

Use of liquid rubber in micromachining focused on flexible large-area biocompatible membranes

Verhaegen, Katarina; Baert, Kris; Puers, Bob; Sansen, Willy; Hermans, Lou; Mertens, Robert (1999)

Use of Machine Learning for the Estimation of Down- and Up-Link Field Exposure in Multi-Source Indoor WiFi Scenarios

Tognola, Gabriella; Plets, David; Chiaramello, Emma; Gallucci, Silvia; Bonato, Marta; Fiocchi, Serena; Parazzini, Marta; Martens, Luc; Joseph, Wout; Ravazzani, Paolo (2021)

Use of MIR-FTIR and k-value measurements to assess potential solutions to reduce damage during porous low-k integration

Beynet, Julien; De Roest, David; Rochat, N.; Kellens, Kristof; Verdonck, Patrick; Sprey, Hessel (2009)

Use of multifunctional carboxylic acids and hydrogen peroxide to improve surface quality and minimize phosphine evolution during chemical mechanical polishing of indium phosphide surfaces

Matovu, John Bogere; Ong, Patrick; Krishnan, Sitaraman; Babu, S.V.; Leunissen, Peter (2013)

Use of optical and electrical measurement techniques throughout the MEMS device qualification process

De Coster, Jeroen (2010)

Use of p- and n-type vapor phase doping and sub-melt laser anneal for extension junctions in sub-32 nm CMOS technology

Nguyen, Duy; Rosseel, Erik; Takeuchi, Shotaro; Everaert, Jean-Luc; Yang, Lijun; Goossens, Jozefien; Moussa, Alain; Clarysse, Trudo; Loo, Roger; Lin, Vic; Vandervorst, Wilfried; Caymax, Matty (2009)

Use of p- and n-type vapor phase doping and sub-melt laser anneal for extension junctions in sub-32 nm CMOS technology

Nguyen, Duy; Rosseel, Erik; Takeuchi, Shotaro; Everaert, Jean-Luc; Yang, Lijun; Goossens, Jozefien; Moussa, Alain; Clarysse, Trudo; Richard, Olivier; Bender, Hugo; Zaima, S.; Sakai, A.; Loo, Roger; Lin, J.C.; Vandervorst, Wilfried; Caymax, Matty (2010)