Browsing by author "Maes, Herman"
Now showing items 61-80 of 294
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Characterization of the Vt-instability un SiO2 HFO2 gate dielectrics
Kerber, Andreas; Cartier, E.; Pantisano, Luigi; Rosmeulen, Maarten; Degraeve, Robin; Kauerauf, Thomas; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2003) -
Charge pumping characterization of germanium MOSFETs
Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007) -
Charge pumping of single interface traps in submicron MOSFET's
Groeseneken, Guido; De Wolf, Ingrid; Bellens, Rudi; Maes, Herman (1994) -
Charge trapping and dielectric reliability of SiO2/AI2O3 gate stacks with TiN electrodes
Kerber, Andreas; Cartier, Eduard; Degraeve, Robin; Roussel, Philippe; Pantisano, Luigi; Kauerauf, Thomas; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2003) -
Charge trapping in SiO2/HfO2 gate dielctrics: comparison between charge-pumping and pulsed I-D-V-G
Kerber, A.; Cartier, E.; Pantisano, Luigi; Degraeve, Robin; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2004) -
Charging instability in n-channel MOSFETs with SiO2/HfO2 gate dielectrics
Kerber, Andreas; Cartier, Eduard; Pantisano, Luigi; Degraeve, Robin; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2002) -
Chemical structure evolution and orientation selection in sol-gel-prepared ferroelectric Pb(Zr,Ti)O-3 thin films
Fè, Laura; Norga, Gerd; Wouters, D. J.; Maes, Herman; Maes, Guido (2001) -
Co-design methodology to provide high esd protection levels in the advanced rf circuits
Vassilev, Vesselin; Thijs, Steven; Lajo-Segura, P.; Groeseneken, Guido; Wambacq, Piet; Leroux, P.; Steyaert, M.; Mahadeva Iyer, Natarajan; Maes, Herman (2003-09) -
Comparison of the suitability of various programming mechanisms used for multilevel non-volatile information storage
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Hendrickx, Paul; Groeseneken, Guido; Maes, Herman (1996) -
Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions
Sibaja-Hernandez, Arturo; Xu, Mingwei; Decoutere, Stefaan; Maes, Herman (2004-05) -
Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures
Nigam, Tanya; Degraeve, Robin; Groeseneken, Guido; Heyns, Marc; Maes, Herman (1998) -
Control and readout of current-induced magnetic flux quantization in a superconducting transformer
Kerner, Christoph; Hackens, Benoit; Golubovic, Dusan; Poli, Stefano; Faniel, Sebastien; Magnus, Wim; Schoenmaker, Wim; Bayot, Vincent; Maes, Herman (2009) -
Control of texture and crystallization in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 electrode layers
Norga, Gerd; Wouters, D. J.; Fè, Laura; Bartic, Andrei; Maes, Herman (1998) -
Control of texture and oxygen stoichiometry in reactively sputtered RuO2 electrode layers for low fatigue PZT FECAPs
Norga, Gerd; Wouters, Dirk; Conard, Thierry; Maes, Herman (1997) -
Critical analysis of the substrate hot-hole injection technique
Van den Bosch, Geert; Groeseneken, Guido; Maes, Herman (1994) -
Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
Pinardi, Kuntjoro; Jain, Uma; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M. (1998) -
Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996) -
Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry
Viapiana, Matteo; Wouters, Dirk; Maes, Herman; Van der Biest, Omer (2004) -
Dependency of the properties of SrxBiyTa2O9 thin films on the Sr and Bi stoichiometry
Viapiana, Matteo; Schwitters, Michael; Wouters, Dirk; Maes, Herman; Van der Biest, Omer (2005) -
Depth profiling of strain using micro-Raman measurements
Atkinson, A.; Jain, Suresh; Maes, Herman; Pinardi, Kuntjoro; Willander, M. (2001)