Browsing by author "Maes, Herman"
Now showing items 41-60 of 294
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Analysis of charge pumping characteristics of single interface traps
Habas, Predrag; De Wolf, Ingrid; Groeseneken, Guido; Stesmans, Andre; Maes, Herman (1997) -
Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs
Degraeve, Robin; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1994) -
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G. (1994) -
Analysis of Iddq failures through spectral photon emission microscopy
Rasras, Mahmoud; De Wolf, Ingrid; Bender, Hugo; Groeseneken, Guido; Maes, Herman; Verhaverbeke, Steven; De Pauw, P. (1998) -
Analysis of Iddq failures through spectral photon emission microscopy
Rasras, Mahmoud; De Wolf, Ingrid; Bender, Hugo; Groeseneken, Guido; Maes, Herman; Verhaverbeke, Steven; De Pauw, P. (1998) -
Analysis of local mechanical stresses in and near tungsten lines on silicon substrates
De Wolf, Ingrid; Ignat, M.; Pozza, G.; Maniguet, L.; Maes, Herman (1999) -
Analysis of process-induced stresses in lateral trench isolation structures for high voltage devices in bonded SOI wafers
Baumgart, H.; Letavic, T. J.; De Wolf, Ingrid; Maes, Herman; Egloff, R. (1995) -
Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
Ogier, Jean-Luc; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1995) -
Applicability of charge pumping on Germanium MOSFETs
Martens, Koen; Kaczer, Ben; Grasser, Tibor; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2008) -
Assessment of oxide reliability and hot carrier degradation in CMOS technology
Maes, Herman; Groeseneken, Guido; Degraeve, Robin; De Blauwe, Jan; Van den Bosch, Geert (1998) -
Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman (1997) -
Back-bias enhanced source-side injection in 0.25μm embedded flash memories
Van Houdt, Jan; Verheyen, P.; Frisson, Jo; Wellekens, Dirk; Lorenzini, Martino; Maes, Herman (1999) -
Basics and applications of charge pumping in submicron MOSFET's
Groeseneken, Guido; Maes, Herman (1998) -
Basics and applications of charge pumping in submicron MOSFET's
Groeseneken, Guido; Maes, Herman (1997) -
Bias Temperature Instabilities in MOSFETs with High-k Dielectrics
Aoulaiche, Marc; Groeseneken, Guido; Maes, Herman (2010) -
C-V Interpretation and the Conductance Technique for III-V and Ge based CMOS
Martens, Koen; Maes, Herman; Groeseneken, Guido (2008) -
Channel hot electron injection versus Fowler-Nordheim tunneling for multilevel charge storage in non-volatile memories
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Hendrickx, Paul; Groeseneken, Guido; Maes, Herman (1997) -
Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown
Crupi, Felice; Degraeve, Robin; Groeseneken, Guido; Nigam, Tanya; Maes, Herman (1998) -
Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
Crupi, Felice; Iannaccone, G.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (2001) -
Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995)