Browsing imec Publications by author "Zahid, Mohammed"
Now showing items 21-40 of 56
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Evaluation and solutions for P/E window instability induced by electron trapping in high-k inter-gate dielectrics of flash memory cells
Tang, Baojun; Zhang, Weidong; Degraeve, Robin; Breuil, Laurent; Blomme, Pieter; Zhang, Jianfu; Ji, Zhigang; Zahid, Mohammed; Toledano Luque, Maria; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Evidence of a new degradation mechanism in high-k dielectrics at elevated temperatures
Sahhaf, Sahar; Degraeve, Robin; O'Connor, Robert; Kaczer, Ben; Zahid, Mohammed; Roussel, Philippe; Pantisano, Luigi; Groeseneken, Guido (2009) -
Experimental identification of unique oxide defect regions by characteristic response of charge pumping
Masuduzzaman, M.; Islam, Ahmad; Degraeve, Robin; Cho, Moon Ju; Zahid, Mohammed; Alam, M.A. (2011-04) -
Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
Degraeve, Robin; Zahid, Mohammed; Van den Bosch, Geert; Blomme, Pieter; Breuil, Laurent; Kaczer, Ben; Mercuri, Marco; Rothschild, Aude; Cacciato, Antonio; Jurczak, Gosia; Groeseneken, Guido; Van Houdt, Jan (2009-10) -
Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
Toledano Luque, Maria; Degraeve, Robin; Zahid, Mohammed; Kaczer, Ben; Blomme, Pieter; Kittl, Jorge; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2011) -
First-principles investigation of high-k dielectrics for non-volatile memories
Pourtois, Geoffrey; Sankaran, Kiroubanand; Radu, Iuliana; Degraeve, Robin; Zahid, Mohammed; Van Elshocht, Sven; Adelmann, Christoph; De Gendt, Stefan; Heyns, Marc; Wouters, Dirk; Kittl, Jorge; Jurczak, Gosia; Rignanese, G.M.; Van Houdt, Jan (2010) -
First-principles investigation of high-k dielectrics for non-volatile memories
Pourtois, Geoffrey; Sankaran, Kiroubanand; Radu, Iuliana; Degraeve, Robin; Zahid, Mohammed; Van Elshocht, Sven; Adelmann, Christoph; De Gendt, Stefan; Heyns, Marc; Wouters, Dirk; Kittl, Jorge; Jurczak, Gosia; Rignanese, G. M.; Van Houdt, Jan (2010) -
First-principles modeling of intrinsic and extrinsic defects in Gamma-Al2O3
Sankaran, Kiroubanand; Pourtois, Geoffrey; Degraeve, Robin; Zahid, Mohammed; Rignanese, Gian-Marco; Van Houdt, Jan (2010) -
Forward gate bias on-state stress on AlGaN/GaN MIS-HEMTs for power switching applications
Wu, Tian-Li; Marcon, Denis; Zahid, Mohammed; Van Hove, Marleen; Stoffels, Steve; Srivastava, Puneet; Decoutere, Stefaan; Groeseneken, Guido (2012) -
Ge FETs gate stack passivation options and their scalability to low EOT
Bellenger, Florence; De Jaeger, Brice; Nyns, Laura; Zahid, Mohammed; Houssa, Michel; Vrancken, Evi; Tseng, Joshua; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc; Hoffmann, Thomas Y. (2010) -
High performance THANVaS memories for MLC charge trap NAND flash
Suhane, Amit; Van den Bosch, Geert; Arreghini, Antonio; Breuil, Laurent; Cacciato, Antonio; Zahid, Mohammed; Debusschere, Ingrid; De Meyer, Kristin; Van Houdt, Jan (2011) -
High temperature behaviour of GaN-on-Si high power MISHEMT devices
Wellekens, Dirk; Venegas, Rafael; Kang, Xuanwu; Zahid, Mohammed; Wu, Tian-Li; Marcon, Denis; Srivastava, Puneet; Van Hove, Marleen; Decoutere, Stefaan (2012) -
High-k dielectrics and metal gates for future generation memory devices
Kittl, Jorge; Opsomer, Karl; Popovici, Mihaela Ioana; Menou, Nicolas; Kaczer, Ben; Wang, Xin Peng; Adelmann, Christoph; Pawlak, Malgorzata; Tomida, Kazuyuki; Rothschild, Aude; Govoreanu, Bogdan; Degraeve, Robin; Schaekers, Marc; Zahid, Mohammed; Delabie, Annelies; Meersschaut, Johan; Polspoel, W.; Clima, Sergiu; Pourtois, Geoffrey; Detavernier, C.; Knaepen, W.; Afanasiev, Valeri; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Maes, Jan; Manger, D.; Vandervorst, Wilfried; Conard, Thierry; Franquet, Alexis; Favia, Paola; Bender, Hugo; Brijs, Bert; Van Elshocht, Sven; Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
High-k dielectrics and metal gates for future generation memory devices
Kittl, Jorge; Opsomer, Karl; Popovici, Mihaela Ioana; Menou, Nicolas; Kaczer, Ben; Wang, Xin Peng; Adelmann, Christoph; Pawlak, Malgorzata; Tomida, Kazuyuki; Rothschild, Aude; Govoreanu, Bogdan; Degraeve, Robin; Schaekers, Marc; Zahid, Mohammed; Delabie, Annelies; Meersschaut, Johan; Polspoel, W.; Clima, Sergiu; Pourtois, Geoffrey; Knaepen, W.; Detavernier, C.; Afanasiev, Valeri; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Fischer, P.; Maes, Jan; Manger, D.; Vandervorst, Wilfried; Conard, Thierry; Franquet, Alexis; Favia, Paola; Bender, Hugo; Brijs, Bert; Van Elshocht, Sven; Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
High-k dielectrics for future generation memory devices
Kittl, Jorge; Opsomer, Karl; Popovici, Mihaela Ioana; Menou, Nicolas; Kaczer, Ben; Wang, Xin Peng; Adelmann, Christoph; Pawlak, Malgorzata; Tomida, Kazuyuki; Rothschild, Aude; Govoreanu, Bogdan; Degraeve, Robin; Schaekers, Marc; Zahid, Mohammed; Delabie, Annelies; Meersschaut, Johan; Polspoel, Wouter; Clima, Sergiu; Pourtois, Geoffrey; Knaepen, W.; Detavernier, C.; Afanasiev, Valeri; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Fischer, Pamela; Maes, Jan; Manger, Dirk; Vandervorst, Wilfried; Conard, Thierry; Franquet, Alexis; Favia, Paola; Bender, Hugo; Brijs, Bert; Van Elshocht, Sven; Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
How far can we analyze oxide traps spatially with charge injection techniques?
Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Zahid, Mohammed; Govoreanu, Bogdan; Kaczer, Ben; Van Houdt, Jan; Groeseneken, Guido (2008-12) -
Hydrogen induced positive charge in Hf-based dielectrics
Zhao, C.Z.; Zhang, J.F.; Zahid, Mohammed; Efthymiou, E.; Lu, Y.; Hall, S.; Peaker, A.R.; Groeseneken, Guido; Pantisano, Luigi; Degraeve, Robin; De Gendt, Stefan; Heyns, Marc (2007) -
Impact of different defects on the kinetics of Negative Bias Temperature Instability of Hafnium stacks
Zhang, J.F.; Zhao, C.Z.; Chang, M.H.; Zahid, Mohammed; Peaker, A.R.; Hall, S; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
Impact of process conditions on interface and high-k trap density studied by variable Tcharge-Tdischarge charge pumping (VT2CP)
Zahid, Mohammed; Degraeve, Robin; Zhang, John; Groeseneken, Guido (2007-09) -
Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory
Zahid, Mohammed; Degraeve, Robin; Breuil, Laurent; Van den Bosch, Geert; Van Houdt, Jan (2013)