Browsing imec Publications by title

Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices

Nicolett, A.S.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2002)

Extraction of the random component of time-dependent variability using matched pairs

Kaczer, Ben; Franco, Jacopo; Roussel, Philippe; Groeseneken, Guido; Chiarella, Thomas; Horiguchi, Naoto; Grasser, Tibor (2015)

Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2010)

Extraction of the silicon film thickness on fully depleted SOI nMOSFETs using the black gate influence

Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2000)

Extraction of the top and sidewall mobility in FinFETs and the impact of fin-patterning processes and gate dielectrics on mobility

Iyengar, Vikram V.; Kottantharayil, Anil; Tranjan, Farid M.; Jurczak, Gosia; De Meyer, Kristin (2007)

Extraction of Time-Domain Characteristics and Selection of Effective Features Using Correlation Analysis to Increase the Accuracy of Petroleum Fluid Monitoring Systems

Mayet, Abdulilah Mohammad; Alizadeh, Seyed Mehdi; Nurgalieva, Karina Shamilyevna; Hanus, Robert; Nazemi, Ehsan; Narozhnyy, Igor M. (2022)

Extraordinary bidirectional scattering of visible light enabled by all-dielectric nanoantenna

Li, Jiaqi; Verellen, Niels; Vercruysse, Dries; Bearda, Twan; Lagae, Liesbet; Van Dorpe, Pol (2016)

Extraordinary inhibition of the field-effect by bound quasiparticles at the interface of a dielectric and the metal-insulatortransition material VO2

Martens, Koen; Jeong, Jae-Woo; Aetukuri, Nagaphani; Rettner, Charles; Shukla, Nikhil; Freeman, Eugene; Esfahani, Davoud; Peeters, Francois; Topuria, Teya; Rice, Phil; Volodin, Alexander; Douhard, Bastien; Vandervorst, Wilfried; Samant, Mahesh; Datta, Suman; Parkin, Stuart (2015)

Extreme contact shrink for back end of line connectivity

Schleicher, Filip; Paolillo, Sara; Decoster, Stefan; Wu, Chen; Vega Gonzalez, Victor; Hasan, Mahmudul; Beral, Christophe; Lazzarino, Frederic (2022-05-10)

Extreme Rainfall Event Classification Using Machine Learning for Kikuletwa River Floods

Mdegela, Lawrence Nehemiah; Municio, Esteban; De Bock, Yorick; Luhanga, Edith; Leo, Judith; Mannens, Erik (2023)

Extreme scaled gate dielectrics by using ALD Hf-based composite materials

Pierreux, Dieter; Machkaoutsan, Vladimir; Tois, E.; Swerts, Johan; Schram, Tom; Adelmann, Christoph; Van Elshocht, Sven; Tseng, Joshua; Ragnarsson, Lars-Ake; Maes, Jan (2009)

Extreme scaled gate dielectrics by using ALD HfO2/SrTiO3 composite structures

Pierreux, Dieter; Machkaoutsan, Vladimir; Tois, E.; Swerts, Johan; Schram, Tom; Adelmann, Christoph; Van Elshocht, Sven; Popovici, Mihaela Ioana; Conard, Thierry; Tseng, Joshua; Ragnarsson, Lars-Ake; Maes, Jan (2009)

Extreme scaling enabled by 5 tracks cells : holistic design-device co-optimization for FinFETs and lateral nanowires

Garcia Bardon, Marie; Sherazi, Yasser; Schuddinck, Pieter; Jang, Doyoung; Yakimets, Dmitry; Debacker, Peter; Baert, Rogier; Mertens, Hans; Badaroglu, Mustafa; Mocuta, Anda; Horiguchi, Naoto; Mocuta, Dan; Raghavan, Praveen; Ryckaert, Julien; Verkest, Diederik; Steegen, An (2016)

Extreme scaling enabled by MX2 transistors: variability challenges (invited)

Smets, Quentin; Arutchelvan, Goutham; Schram, Tom; Verreck, Devin; Groven, Benjamin; Cott, Daire; Ahmed, Zubair; Shi, Yuanyuan; Sutar, Surajit; Nalin Mehta, Ankit; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana (2021)

Extreme scaling of low-k dielectric for sub 45 nm BEOL roadmaps

Verdonck, Patrick (2009)

Extreme scaling of optical lithography: overview of process integration issues

Ronse, Kurt; Wiaux, Vincent; Verhaegen, Staf; Van Look, Lieve; Bekaert, Joost; Laidler, David; Cheng, Shaunee; Maenhoudt, Mireille; Vandenberghe, Geert; Dusa, Mircea (2009)

Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks

Alves Pereira, Luis Filipe; De Beenhouwer, Jan; Kastner, Johann; Sijbers, Jan (2020)

Extreme spectral transmission fluctuations in silicon nanowires induced by backscattering

Li, Ang; Xing, Yufei; Van Laer, Raphael; Baets, Roel; Bogaerts, Wim (2016-08)

Extreme thinned-wafer bonding using low temperature curable polyimide for advanced waferlevel integrations

Bertheau, Julien; Inoue, Fumihiro; Phommahaxay, Alain; Peng, Lan; Iacovo, Serena; Rassoul, Nouredine; Sleeckx, Erik; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric; Nakamura, Atsushi (2018)

Extreme thinning of Si wafers for via-last and multi wafer stacking applications

Jourdain, Anne; De Vos, Joeri; Rassoul, Nouredine; Zahedmanesh, Houman; Miller, Andy; Beyer, Gerald; Beyne, Eric; Walsby, Edward; Patel, Jash; Ansell, Oliver; Ashraf, Huma; Thomas, Dave; Li, Shifang; Chang, Timothy; Hiebert, Stephen; Cross, Andrew; Stoerring, Moritz (2018)