Recently added

Rapid recovery process of plasma damaged porous low-k dielectrics by wet surface modifying treatment

Iwasaki, A,; Higuchi, A.; Komori, K.; Sato, M.; Kesters, Els; Le, Quoc Toan; Holsteyns, Frank (2016)

Influence of different UTBB SOI technologies on analog parameters

Itocazu, Vitor. T.; Sonneberg, Victor; Simoen, Eddy; Claeys, Cor; Martino, Joao A. (2016)

Observing CoAP groups efficiently

Ishaq, Isam; Hoebeke, Jeroen; Moerman, Ingrid; Demeester, Piet (2016)

Impact of point defects on the electronic and transport properties of silicene nanoribbons

Iordanidou, Konstantina; Houssa, Michel; van den Broek, Bas; Pourtois, Geoffrey; Afanas'ev, Valery; Stesmans, Andre (2016)

SEM based overlay measurement between resist and buried patterns

Inoue, Osamu; Okagawa, Yutaka; Hasumi, Kazuhisa; Shao, Chuanyu; Leray, Philippe; Halder, Sandip; Lorusso, Gian; Baudemprez, Bart (2016)

Edge trimming for wafer-to-wafer 3D integration

Inoue, Fumihiro; Visker, Jakob; Jourdain, Anne; Moeller, Berthold; Yokoyama, Kaori; Peng, Lan; Kosemura, Daisuke; De Wolf, Ingrid; Rebibis, Kenneth June; Miller, Andy; Beyne, Eric; Sleeckx, Erik (2016)

Characterization of extreme Si thinning proces for wafer-to-wafer stacking

Inoue, Fumihiro; Jourdain, Anne; De Vos, Joeri; Peng, Lan; Liebens, Maarten; Armini, Silvia; Uedono, Akira; Rebibis, Kenneth June; Miller, Andy; Beyne, Eric; Sleeckx, Erik (2016)

Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers

Ike, Shinichi; Simoen, Eddy; Shimura, Yosuke; Hikavyy, Andriy; Vandervorst, Wilfried; Loo, Roger; Takeuchi, Wakana; Nakatsuka, Osamu; Zaima, Shigeaki (2016)

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

Ike, Shinichi; Simoen, Eddy; Shimura, Yosuke; Hikavyy, Andriy; Vandervorst, Wilfried; Loo, Roger; Takeuchi, Wakana; Nakatsuka, Osamu; Zaima, Shigeaki (2016)

Lectin-glycan interaction network-based identification of host receptors of microbial pathogenic adhesins

Ielasi, Francesco; Alioscha-Perez, Michel; Donohue, Dagmara; Claes, Sandra; Sahli, Hichem; Schols, Dominique; Willaert, Ronnie (2016)

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

Huynh Bao, Trong; Sakhare, Sushil; Yakimets, Dmitry; Ryckaert, Julien; Thean, Aaron; Mercha, Abdelkarim; Verkest, Diederik; Wambacq, Piet (2016)

Toward the 5nm technology: layout optimization and performance benchmark for logic/SRAMs using lateral and vertical GAA FETs

Huynh Bao, Trong; Ryckaert, Julien; Sakhare, Sushil; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron; Wambacq, Piet (2016)

imec Publications: Recent submissions

Rapid recovery process of plasma damaged porous low-k dielectrics by wet surface modifying treatment

Influence of different UTBB SOI technologies on analog parameters

Observing CoAP groups efficiently

Impact of point defects on the electronic and transport properties of silicene nanoribbons

SEM based overlay measurement between resist and buried patterns

Edge trimming for wafer-to-wafer 3D integration

Characterization of extreme Si thinning proces for wafer-to-wafer stacking

Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

Lectin-glycan interaction network-based identification of host receptors of microbial pathogenic adhesins

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

Toward the 5nm technology: layout optimization and performance benchmark for logic/SRAMs using lateral and vertical GAA FETs

Low frequency noise in single GaAsSb nanowires with self-induced compositional gradients

Computation-skip error mitigation scheme for power supply voltage scaling in recursive applications

Fine-grained hardware switching scheme for power reduction in multiplication

An algorithm to identify cornerstones of digital circuits

A 28 nm CMOS 7.04 Gsps polar digital front-end processor for 60 GHz transmitter

Device/system performance modeling of stacked lateral NWFET logic

Low driving voltage band-filling-based III-V-on-silicon electroabsorption modulator

Dopant-free hole-transporting material with a C-3h symmetrical truxene core for highly efficient perovskite solar cells

imec Publications: Recent submissions

Rapid recovery process of plasma damaged porous low-k dielectrics by wet surface modifying treatment ﻿

Influence of different UTBB SOI technologies on analog parameters ﻿

Observing CoAP groups efficiently ﻿

Impact of point defects on the electronic and transport properties of silicene nanoribbons ﻿

SEM based overlay measurement between resist and buried patterns ﻿

Edge trimming for wafer-to-wafer 3D integration ﻿

Characterization of extreme Si thinning proces for wafer-to-wafer stacking ﻿

Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers ﻿

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects ﻿

Lectin-glycan interaction network-based identification of host receptors of microbial pathogenic adhesins ﻿

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs ﻿

Toward the 5nm technology: layout optimization and performance benchmark for logic/SRAMs using lateral and vertical GAA FETs ﻿

Low frequency noise in single GaAsSb nanowires with self-induced compositional gradients ﻿

Computation-skip error mitigation scheme for power supply voltage scaling in recursive applications ﻿

Fine-grained hardware switching scheme for power reduction in multiplication ﻿

An algorithm to identify cornerstones of digital circuits ﻿

A 28 nm CMOS 7.04 Gsps polar digital front-end processor for 60 GHz transmitter ﻿

Device/system performance modeling of stacked lateral NWFET logic ﻿

Low driving voltage band-filling-based III-V-on-silicon electroabsorption modulator ﻿

Dopant-free hole-transporting material with a C-3h symmetrical truxene core for highly efficient perovskite solar cells ﻿

Rapid recovery process of plasma damaged porous low-k dielectrics by wet surface modifying treatment

Influence of different UTBB SOI technologies on analog parameters

Observing CoAP groups efficiently

Impact of point defects on the electronic and transport properties of silicene nanoribbons

SEM based overlay measurement between resist and buried patterns

Edge trimming for wafer-to-wafer 3D integration

Characterization of extreme Si thinning proces for wafer-to-wafer stacking

Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers

Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

Lectin-glycan interaction network-based identification of host receptors of microbial pathogenic adhesins

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

Toward the 5nm technology: layout optimization and performance benchmark for logic/SRAMs using lateral and vertical GAA FETs

Low frequency noise in single GaAsSb nanowires with self-induced compositional gradients

Computation-skip error mitigation scheme for power supply voltage scaling in recursive applications

Fine-grained hardware switching scheme for power reduction in multiplication

An algorithm to identify cornerstones of digital circuits

A 28 nm CMOS 7.04 Gsps polar digital front-end processor for 60 GHz transmitter

Device/system performance modeling of stacked lateral NWFET logic

Low driving voltage band-filling-based III-V-on-silicon electroabsorption modulator

Dopant-free hole-transporting material with a C-3h symmetrical truxene core for highly efficient perovskite solar cells