Authors

Chai, Zheng; Ma, Jigang; Zhang, Weidong; Govoreanu, Bogdan; Simoen, Eddy; Zhang, Jiang; Li, Ziqhiang; Gao, R.; Groeseneken, Guido; Jurczak, Gosia

Conference

IEEE Symposium on VLSI Technology

Title

RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism

Publication type

Proceedings paper

Embargo date

9999-12-31