Publication:
High-throughput process chain for single electron transistor devices based on field-emission scanning probe lithography and Smart Nanoimprint technology
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2001 since deposited on 2021-10-27
2last month
1last week
Acq. date: 2026-01-08
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Metrics
Views
2001 since deposited on 2021-10-27
2last month
1last week
Acq. date: 2026-01-08
Citations