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Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
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Authors
Cao, Jingchen
;
Wang, Peng Fei
;
Li, Xun
;
Guo, Zixiang
;
Zhang, En Xia
;
Reed, Robert A.
;
Alles, Michael L.
;
Schrimpf, Ronald D.
;
Fleetwood, Daniel M.
;
Arreghini, Antonio
;
Rosmeulen, Maarten
;
Bastos, Joao P.
;
Van den Bosch, Geert
;
Linten, Dimitri
DOI
10.1109/TNS.2021.3133407
ISSN
0018-9499
Issue
3
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume
69
Title
Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
Publication type
Journal article
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3
20.500.12860/39554.3
*
2022-06-28T14:37:59Z
validation by library/open access desk
2
20.500.12860/39554.2
2022-05-20T07:46:34Z
validation by imec author
1
20.500.12860/39554
2022-03-30T02:07:18Z
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