Browsing Conference contributions by title

WiSH-WalT: A framework for controllable and reproducible LoRa testbeds

Lome, Q.; Dublé, E.; Rousseau, F.; Moerman, Ingrid; Giannoulis, Spilios; Duda, A. (2018-09)

Within-die and within-wafer CMP process characterization and monitoring using PWG Fizeau interferometry system

Teugels, Lieve; Devriendt, Katia; Heylen, Nancy; Tsvetanova, Diana; Struyf, Herbert; Bast, Gerhard; Ramkhalawon, Roshita; Mueller, Dieter; Simpson, Gavin; Ulea, Neli (2016)

Women and ICT in South Africa: mental models on gender and ICT in marginalised communities

Popkas, Carlynn; Craffert, Leona; Van Audenhove, Leo; Marien, Ilse (2019)

WordCrowd - A location-based application to explore the city based on geo-social media and semantics

Milleville, Kenzo; Ali, Dilawar; Porras-Bernardez, F.; Verstockt, Steven; Van de Weghe, Nico; Gartner, G. (2019)

Work function (WF) simulations of Ta/HfO2, Ta2C/HfO2 and Ta2C/La2O3/HfO2 capped high-k stacks

Van der Heyden, Nikolaas; Pourtois, Geoffrey; De Gendt, Stefan; Heyns, Marc; Stesmans, Andre (2007)

Work function engineering by FUSI and its impact on the performance and reliability of oxynitride and Hf-silicate based MOSFETs

Veloso, Anabela; Kottantharayil, Anil; Witters, Liesbeth; Brus, Stephan; Kubicek, Stefan; de Marneffe, Jean-Francois; Sijmus, Bram; Devriendt, Katia; Lauwers, Anne; Kauerauf, Thomas; Jurczak, Gosia; Biesemans, Serge (2004)

Workshop : Implementing hierarchical birationality

Cottam, Ron; Ranson, Willy; Vounckx, Roger (2014)

Workshops at the Web Conference 2023

Ongenae, Femke; Tommasini, Riccardo (2023)

World-wide standardization effort on leaching measurement methodology

Gronheid, Roel; Baerts, Christina; Caporalo, Stefan; Alexander, Jim; Rathsack, Ben; Scheer, Steven; Ohmori, Katsumi; Rice, Bryan (2007)

Worst-case EMC investigation of single-wire transmission lines based on Taylor arithmetic

Manfredi, Paolo; Trinchero, R.; Stievano, S. (2017-08)

Worst-case throughput analysis for parametric rate and parametric actor execution time scenario-aware dataflow graphs

Skelin, Mladen; Geilen, Marc; Catthoor, Francky; Hendseth, Sverre (2014)

Woven multi-ribbon interconnection for back-contact cells: extending the functionality of the encapsulant

Van Dyck, Rik; Borgers, Tom; Govaerts, Jonathan; Voroshazi, Eszter; Van Vuure, Aart Willem; Poortmans, Jef (2019)

WOx resistive memory elements for scaled Flash memories

Gorji Ghalamestani, Sepideh; Goux, Ludovic; Díaz-Droguett, Donovan; Groeseneken, Guido; Wouters, Dirk; Lisoni, Judit (2011)

Wrinkle formation in conformable liquid crystal cells for use in a contact lens display

De Smet, Jelle; Avci, Aykut; Beernaert, Roel; Cuypers, Dieter; De Smet, Herbert (2011)

Write-Verify Scheme for IGZO DRAM in Analog in-Memory Computing

Caselli, Michele; Subhechha, Subhali; Debacker, Peter; Mallik, Arindam; Verkest, Diederik (2022)

Write/erase degradation and disturb effects in source-side injection Flash EEPROM devices

Wellekens, Dirk; Van Houdt, Jan; Faraone, Lorenzo; Groeseneken, Guido; Maes, Herman (1994)

WS2 chemical vapor deposition with WF6 and H2S: influence of the substrate

Tomczak, Yoann; Groven, Benjamin; Caymax, Matty; Van Elshocht, Sven; Radu, Iuliana; Delabie, Annelies (2017)

WS2 MOSFETs: significant performance improvement with Mg contacts

Sutar, Surajit; Mongillo, Massimo; El Kazzi, Salim; Asselberghs, Inge; Huyghebaert, Cedric; Caymax, Matty; Lin, Dennis; Radu, Iuliana (2019)

WS2 transistors on 300 mm wafers with BEOL compatibility

Schram, Tom; Smets, Quentin; Groven, Benjamin; Heyne, Markus; Kunnen, Eddy; Thiam, Arame; Devriendt, Katia; Delabie, Annelies; Lin, Dennis; Lux, Marcel; Chiappe, Daniele; Asselberghs, Inge; Brus, Stephan; Huyghebaert, Cedric; Sayan, Safak; Juncker, Aurélie; Caymax, Matty; Radu, Iuliana (2017)

WXCA LCOS projection panel with vertically aligned nematic LC

Cuypers, Dieter; Van den Steen, J.; Van Doorselaer, Geert; De Smet, Herbert; Van Calster, Andre (2003)