Browsing Conference contributions by imec author "d0a6725a01d2af74872987d3934e0b3ed87b5b4d"
Now showing items 21-39 of 39
-
Impact of litho-patterning variations on the electrical performance and variability of advanced interconnects
Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Kocaay, Deniz; Contino, Antonino; Croes, Kristof; Saad, Yves; Gao, Weimin; Moroz, Victor; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018) -
Inflection points in interconnect research and trends for 2nm and beyond in order to solve the RC bottleneck
Tokei, Zsolt; Vega Gonzalez, Victor; Murdoch, Gayle; O'Toole, Martin; Croes, Kristof; Baert, Rogier; van der Veen, Marleen; Adelmann, Christoph; Soulie, Jean-Philippe; Boemmels, Juergen; Wilson, Chris; Park, Seongho; Sankaran, Kiroubanand; Pourtois, Geoffrey; Swerts, Johan; Paolillo, Sara; Decoster, Stefan; Mao, Ming; Lazzarino, Frederic; Versluijs, Janko; Blanco, Victor; Ercken, Monique; Kesters, Els; Le, Quoc Toan; Holsteyns, Frank; Heylen, Nancy; Teugels, Lieve; Devriendt, Katia; Struyf, Herbert; Morin, Pierre; Jourdan, Nicolas; Van Elshocht, Sven; Ciofi, Ivan; Gupta, Anshul; Zahedmanesh, Houman; Vanstreels, Kris; Na, Myung Hee (2020) -
Interconnect Design-Technology Co-Optimization for Sub-3nm Technology Nodes
Baert, Rogier; Ciofi, Ivan; Patli, Sudhir; Zografos, Odysseas; Sarkar, Satadru; Chehab, Bilal; Jang, Doyoung; Spessot, Alessio; Ryckaert, Julien; Tokei, Zsolt (2020) -
IR-Drop Analysis of Hybrid Bonded 3D-ICs with Backside Power Delivery and mu- & n- TSVs
Genneret, B.; Chou, R.; Sisto, Giuliano; Chehab, Bilal; Baert, Rogier; Chen, Rongmei; Weckx, Pieter; Ryckaert, Julien; Van der Plas, Geert; Beyne, Eric; Milojevic, Dragomir (2021) -
Low track height standard-cells enable high-placement density and low-BEOL cost
Debacker, Peter; Mattii, Luca; Sherazi, Yasser; Baert, Rogier; Gerousis, Vassilios; Nauts, Claire; Raghavan, Praveen; Ryckaert, Julien; Kim, Ryan Ryoung han; Verkest, Diederik (2017) -
Metal stack optimization for low-power and high-density for N7-N5
Raghavan, Praveen; Firouzi, Farshad; Matti, L.; Debacker, Peter; Baert, Rogier; Sherazi, Yasser; Trivkovic, Darko; Gerousis, V.; Dusa, Mircea; Ryckaert, Julien; Tokei, Zsolt; Verkest, Diederik; McIntyre, Greg; Ronse, Kurt (2016) -
Novel forksheet device architecture as ultimate logic scaling device towards 2nm
Weckx, Pieter; Ryckaert, Julien; Dentoni Litta, Eugenio; Yakimets, Dmitry; Matagne, Philippe; Schuddinck, Pieter; Jang, Doyoung; Chehab, Bilal; Baert, Rogier; Gupta, Mohit; Oniki, Yusuke; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Spessot, Alessio; Verkest, Diederik (2019) -
Power-performance trade-offs for lateral nanosheets on ultra-scaled standard cells
Garcia Bardon, Marie; Sherazi, Yasser; Jang, Doyoung; Yakimets, Dmitry; Schuddinck, Pieter; Baert, Rogier; Mertens, Hans; Mattii, Luca; Parvais, Bertrand; Mocuta, Anda; Verkest, Diederik (2018) -
RC modeling, scaling trends and mitigation approaches
Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Contino, Antonino; Gupta, Anshul; Croes, Kristof; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018) -
Runtime scheduling for video decoding on heterogeneous architectures
Blanch, Carolina; Baert, Rogier; Coene, Paul; D'Hondt, Maja; Ma, Zhe; Wuyts, Roel (2011) -
Semi-empirical interconnect resistance model for advanced technology nodes
Roussel, Philippe; Ciofi, Ivan; Degraeve, Robin; Vega Gonzalez, Victor; Jourdan, Nicolas; Baert, Rogier; Linten, Dimitri; Boemmels, Juergen; Tokei, Zsolt; Groeseneken, Guido; Thean, Aaron (2016) -
Single exposure EUV patterning for BEOL metal layers on the imec iN7 platform
Blanco, Victor; Bekaert, Joost; Mao, Ming; Kutrzeba Kotowska, Bogumila; Lariviere, Stephane; Ciofi, Ivan; Baert, Rogier; Kim, Ryan Ryoung han; Gallagher, Emily; Hendrickx, Eric; Tan, Ling Ee; Gillijns, Werner; Trivkovic, Darko; Leray, Philippe; Halder, Sandip; Gallagher, Matt; Lazzarino, Frederic; Paolillo, Sara; Wan, Danny; Mallik, Arindam; Sherazi, Yasser; McIntyre, Greg; Dusa, Mircea; Rusu, Paul; Hollink, Thijs; Fliervoet, Timon; Wittebrood, Friso (2017) -
SRAM enablement beyond N7: a BTI study
Gupta, Mohit; Weckx, Pieter; Cosemans, Stefan; Schuddinck, Pieter; Baert, Rogier; Jang, Doyoung; Sherazi, Yasser; Raghavan, Praveen; Kaczer, Ben; Spessot, Alessio; Mocuta, Anda; Dehaene, Wim (2017) -
Supervia Process Integration and Reliability Compared to Stacked Vias Using Barrierless Ruthenium
Vega Gonzalez, Victor; Puliyalil, Harinarayanan; Versluijs, Janko; Lesniewska, Alicja; Varela Pedreira, Olalla; Baert, Rogier; Paolillo, Sara; Decoster, Stefan; Schleicher, Filip; Montero Alvarez, Daniel; Bekaert, Joost; Kesters, Els; Le, Quoc Toan; Lorant, Christophe; Teugels, Lieve; Heylen, Nancy; Jourdan, Nicolas; El-Mekki, Zaid; van der Veen, Marleen; Ciofi, Ivan; Briggs, Basoene; Heijlen, Jeroen; Dupas, Luc; De Wachter, Bart; Vancoille, Eric; Webers, Tomas; Vats, Hemant; Rynders, Luc; Cupak, Miroslav; Lee, Jae Uk; Drissi, Youssef; Halipre, Luc; Charley, Anne-Laure; Verdonck, Patrick; Witters, Thomas; Van Gompel, Sander; Kimura, Yosuke; Demonie, Ingrid; Lazzarino, Frederic; Ercken, Monique; Kim, Ryan Ryoung han; Trivkovic, Darko; Croes, Kristof; Leray, Philippe; Jaysankar, Manoj; Wilson, Chris; Murdoch, Gayle; Tokei, Zsolt (2020) -
System-level impact of interconnect line-edge roughness
Baert, Rogier; Ciofi, Ivan; Roussel, Philippe; Mattii, Luca; Debacker, Peter; Tokei, Zsolt (2018) -
TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
Mallik, Arindam; Zuber, Paul; Liu, Tsung-Te; Chava, Bharani; Ballal, Bhavana; Royer Del Barrio, Pablo; Baert, Rogier; Croes, Kris; Ryckaert, Julien; Badaroglu, Mustafa; Mercha, Abdelkarim; Verkest, Diederik (2013) -
The future is dynamic - adaptive runtime resource management for heterogeneous computer platforms
Baert, Rogier; Blanch, Carolina; Coene, Paul; D'Hondt, Maja; Ma, Zhe; Wuyts, Roel (2009) -
Three-layer BEOL process integration with supervia and self-aligned-block options for the 3nm node
Vega Gonzalez, Victor; Wilson, Chris; Briggs, Basoene; Decoster, Stefan; Versluijs, Janko; Lesniewska, Alicja; Paolillo, Sara; Baert, Rogier; Puliyalil, Harinarayanan; Bekaert, Joost; Kesters, Els; Le, Quoc Toan; Lorant, Christophe; Varela Pedreira, Olalla; Teugels, Lieve; Heylen, Nancy; El-Mekki, Zaid; van der Veen, Marleen; Webers, Tomas; Vats, Hemant; Rynders, Luc; Cupak, Miroslav; Lee, Jae Uk; Drissi, Youssef; Halipre, Luc; Charley, Anne-Laure; Verdonck, Patrick; Witters, Thomas; Van Gompel, Sander; Kimura, Yosuke; Jourdan, Nicolas; Ciofi, Ivan; Gupta, Anshul; Contino, Antonino; Boccardi, Guillaume; Lariviere, Stephane; Dupas, Luc; De Wachter, Bart; Vancoille, Eric; Lazzarino, Frederic; Ercken, Monique; Debacker, Peter; Kim, Ryan Ryoung han; Trivkovic, Darko; Croes, Kristof; Leray, Philippe; Dillemans, Leander; Chen, Yi-Fan; Tokei, Zsolt (2019) -
Variability of quadruple-patterning interconnect processes
Baert, Rogier; Ciofi, Ivan; Wilson, Chris; Vega Gonzalez, Victor; Boemmels, Juergen; Tokei, Zsolt; Ryckaert, Julien; Raghavan, Praveen; Mercha, Abdelkarim; Verkest, Diederik (2015)