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Conference contributions
Recent submissions
imec Publications Repository
imec Publications
Conference contributions
Recent submissions
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Conference contributions: Recent submissions
Now showing items 5961-5980 of 20249
Statistical characterization and modeling of drain current local and global variability in 14nm FinFETs
Karatsori, T.
;
Theodorou, C.
;
Lavieville, R.
;
Chiarella, Thomas
;
Mitard, Jerome
;
Horiguchi, Naoto
;
Dimitriadis, C.A
;
Ghibaudo, Gérard
(
2017
)
Wireless industrial communication for connected shuttle systems in warehouses
Karaagac, Abdulkadir
;
Haxhibeqiri, Jetmir
;
Joseph, Wout
;
Moerman, Ingrid
;
Hoebeke, Jeroen
(
2017
)
Evaluation of accurate indoor localization systems in industrial environments
Karaagac, Abdulkadir
;
Haxhibeqiri, Jetmir
;
Ridolfi, Matteo
;
Joseph, Wout
;
Moerman, Ingrid
;
Hoebeke, Jeroen
(
2017-08
)
Technology for defectivity improvement in resist coating and developing process in EUV lithography process
Kamei, Yuya
;
Shiozawa, Takahiro
;
Kawakami, Shinichiro
;
Shite, Hideo
;
Ichinomiya, Hiroshi
;
Enomoto, Masashi
;
Nafus, Kathleen
;
Demand, Marc
;
Foubert, Philippe
(
2017
)
Effect of Al2O3 and SiO2 Abrasives on the CMP of molybdenum using different polishing parameters
Kalantzis, Panagiotis
;
Teugels, Lieve
;
De Gendt, Stefan
(
2017-10
)
An overview of different business models for public Wi-Fi and their implications on indirect revenue
Kaiser, T.W.
;
Verbrugge, Sofie
;
Van Der Wee, Marlies
;
Colle, Didier
(
2017-07
)
Modern trends in nanoelectronics and ultra-thin-film flexible electronics
Kadashchuk, Andriy
(
2017
)
Benchmarking time-dependent variability of junctionless nanowire FETs
Kaczer, Ben
;
Rzepa, G.
;
Franco, Jacopo
;
Weckx, Pieter
;
Vaisman Chasin, Adrian
;
Putcha, Vamsi
;
Bury, Erik
;
Simicic, Marko
;
Roussel, Philippe
;
Hellings, Geert
;
Veloso, Anabela
;
Matagne, Philippe
;
Grasser, T.
;
Linten, Dimitri
(
2017
)
Integration of III-V light sources on a silicon photonics circuits by transfer printing
Juvert Sandez, Joan
;
Cassese, Tommaso
;
Uvin, Sarah
;
De Groote, Andreas
;
Snyder, Brad
;
De Heyn, Peter
;
Verheyen, Peter
;
Trindade, Antonio Jose
;
Bower, Christophe
;
Romagnoli, Marco
;
Roelkens, Gunther
;
Van Thourhout, Dries
(
2017
)
Two novel MEMS actuator systems for self-aligned integrated 3D optical coherent tomography scanners
Jovic, Aleksandar
;
Pandraud, Gregory
;
Sanchez, Nuria
;
Sancho, Juan
;
Zinoviev, Kirill
;
Rubio, Jose L.
;
Margallo, Eduardo
;
Sarro, Pasqualina M.
(
2017
)
Overcoming EUV mask blank defects: what we can, and what we should
Jonckheere, Rik
(
2017
)
A shared multi-stakeholder platform for IoT: Poster
Jonckers, Dimitri
;
Hovsepyan, Aram
;
Lagaisse, Bert
;
Joosen, Wouter
(
2017
)
Impact of acid statistics on EUV local critical dimension uniformity
Jiang, Jing
;
De Simone, Danilo
;
Yildirim, Oktay
;
Meeuwissen, Marieke
;
Hoefnagels, Rik
;
Rispens, Gijs
;
Derks, Paul
;
Custers, Rolf
(
2017
)
Difference in EUV photoresist design towards reduction of LWR and LCDU
Jiang, Jing
;
De Simone, Danilo
;
Vandenberghe, Geert
(
2017
)
The social construction of targeted television advertising: The importance of "social arrangements" in the development of targeted television advertising in Flanders
Jennes, Iris
;
Van Den Broeck, Wendy
(
2017-06
)
Large-area scalable perovskite/silicon multijunction solar modules
Jaysankar, Manoj
;
Gehlhaar, Robert
;
Paetzold, Ulrich
;
Debucquoy, Maarten
;
Aernouts, Tom
;
Poortmans, Jef
(
2017
)
Single-trace side-channel attacks on scalar multiplications with precomputations
Jarvinen, Kimmo
;
Balasch, Josep
(
2017
)
Fast reconstruction of CFRP X-ray images based on a neural network filtered backprojection approach
Janssens, Eline
;
Senck, Sascha
;
Heinzl, Christoph
;
Kastner, Johann
;
De Beenhouwer, Jan
;
Sijbers, Jan
(
2017
)
Dual axis Dark Field Contrast Tomography for visualisation of scattering directions in a CFRP sample
Janssens, Eline
;
De Beenhouwer, Jan
;
Sanctorum, J.
;
Senck, S.
;
Heinzl, C.
;
Sijbers, Jan
(
2017
)
Highly reproducible single-crystalline organic thin-film transistors by minimizing morphological defects in crystalline templating layers
Janneck, Robby
;
Pilet, Nicolas
;
Bommanaboyena, Satya Prakash
;
Watts, Benjamin
;
Heremans, Paul
;
Genoe, Jan
;
Rolin, Cedric
(
2017
)
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