Recently added

Enabling sub 20nm Cu metallization with PEALD Ru-TiN barrier and ELD seed

Siew, Yong Kong; Swerts, Johan; Dictus, Dries; El-Mekki, Zaid; Armini, Silvia; Dordi, Yezdi; Yoon, Alex; Kolics, Artur; Barbarin, Yohan; Croes, Kristof; Boemmels, Juergen; Tokei, Zsolt (2012)

System optimization methodology for integrated piezoelectric MEMS resonator biochemical sensors

Sieben-Xu, Ling; Pettine, Julia; Petrescu, Violeta; Vandecasteele, Marianne; Karabacak, Devrez (2012)

Latest cluster performance for EUV lithography

Shite, Hideo; Matsunaga, Koichi; Nafus, Kathleen; Kosugi, H.; Foubert, Philippe; Hermans, Jan; Hendrickx, Eric; Goethals, Mieke; Van Den Heuvel, Dieter (2012)

Impact of Sn on Ga activation in heteroepitaxial Ge1-xSnx layer

Shimura, Y.; Nakatsuka, O.; Vincent, Benjamin; Gencarelli, Federica; Clarysse, Trudo; Vandervorst, Wilfried; Caymax, Matty; Loo, Roger; Jensen, A.; Petersen, D.H.; Zaima, S. (2012)

Tailored and tapered metallic gratings for enhanced absorption or transmission

Shen, Honghui; Abass, Aimi; Burgelman, Marc; Maes, Bjorn (2012)

Thin-film solar cells with combined metallic enhancements

Shen, Honghui; Abass, Aimi; Burgelman, Marc; Maes, Bjorn (2012)

Ultra low power litho friendly local assist circuitry for variability resilient 8T SRAM

Sharma, Vibhu; Cosemans, Stefan; Ashouei, Maryam; Huisken, Jos; Catthoor, Francky; Dehaene, Wim (2012)

Advanced 300-mm waferscale patterning for silicon photonics devices with record low loss and phase errors

Selvaraja, Shankar; Murdoch, Gayle; Milenin, Alexey; Delvaux, Christie; Ong, Patrick; Pathak, Shibnath; Vermeulen, Diedrik; Sterckx, Gunther; Winroth, Gustaf; Verheyen, Peter; Lepage, Guy; Bogaerts, Wim; Baets, Roel; Van Campenhout, Joris; Absil, Philippe (2012)

Si photonic device uniformity improvement using wafer-scale location specific processing

Selvaraja, Shankar; Fernandez, Luis; Vanslembrouck, Michael; Everaert, Jean-Luc; Dumon, Pieter; Van Campenhout, Joris; Bogaerts, Wim; Absil, Philippe (2012)

Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopy

Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2012)

Standard cell level parasitics assessment in 20nm BPL and 14nm BFF

Schuddinck, Pieter; Badaroglu, Mustafa; Stucchi, Michele; Demuynck, Steven; Hikavyy, Andriy; Garcia Bardon, Marie; Mercha, Abdelkarim; Mallik, Arindam; Chiarella, Thomas; Kubicek, Stefan; Athimulam, Raja; Collaert, Nadine; Horiguchi, Naoto; Debusschere, Ingrid; Thean, Aaron; Altimime, Laith; Verkest, Diederik (2012)

Hafnium oxide based CMOS compatible ferroelectric materials

Schroeder, Uwe; Martin, D.; Mueller, J.; Yurchuk, E.; Mueller, S.; Adelmann, Christoph; Schloesser, T.; van Bentum, R.; Mikolajick, Thomas (2012)

Non-volatile data storage in 28nm ferroelectric FETs

Schroeder, U.; Mueller, J.; Yurchuk, E.; Mueller, S.; Martin, D.; Adelmann, Christoph; Mikolajick, T. (2012)

Elemental redistribution of Pt and Pd in nickel silicides: a comparative study

Schrauwen, A.; Demeulemeester, Jelle; Kumar, Arul; De Schutter, B.; Vandervorst, Wilfried; Detavernier, C.M.; Comrie, C.M.; Temst, Kristiaan; Vantomme, Andre (2012)

Mixed-mode simulations for power-on ESD analysis

Scholz, Mirko; Shibkov, Andrei; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2012)

Mixed-mode simulations for power-on ESD analysis

Scholz, Mirko; Shibkov, Andrei; Chen, Shih-Hung; Linten, Dimitri; Sawada, Masanori; Vandersteen, Gerd; Groeseneken, Guido (2012-10)

Impact of tester source impedance on HBM failure level

Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Johnsson, David; Groeseneken, Guido (2012)

Pitfalls when using the SEED methodology

Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Ken; Groeseneken, Guido (2012)

Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester

Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Johnsson, David; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vandersteen, Gerd; Sawada, Masanori; Groeseneken, Guido (2012)

Reduction of analogue bandwidth requirement in photonic on-chip reservoir computing

Schneider, Bendix; Bienstman, Peter; Dambre, J. (2012)

Conference contributions: Recent submissions

Enabling sub 20nm Cu metallization with PEALD Ru-TiN barrier and ELD seed ﻿

System optimization methodology for integrated piezoelectric MEMS resonator biochemical sensors ﻿

Latest cluster performance for EUV lithography ﻿

Impact of Sn on Ga activation in heteroepitaxial Ge1-xSnx layer ﻿

Tailored and tapered metallic gratings for enhanced absorption or transmission ﻿

Thin-film solar cells with combined metallic enhancements ﻿

Ultra low power litho friendly local assist circuitry for variability resilient 8T SRAM ﻿

Advanced 300-mm waferscale patterning for silicon photonics devices with record low loss and phase errors ﻿

Si photonic device uniformity improvement using wafer-scale location specific processing ﻿

Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopy ﻿

Standard cell level parasitics assessment in 20nm BPL and 14nm BFF ﻿

Hafnium oxide based CMOS compatible ferroelectric materials ﻿

Non-volatile data storage in 28nm ferroelectric FETs ﻿

Elemental redistribution of Pt and Pd in nickel silicides: a comparative study ﻿

Mixed-mode simulations for power-on ESD analysis ﻿

Mixed-mode simulations for power-on ESD analysis ﻿

Impact of tester source impedance on HBM failure level ﻿

Pitfalls when using the SEED methodology ﻿

Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester ﻿

Reduction of analogue bandwidth requirement in photonic on-chip reservoir computing ﻿

Enabling sub 20nm Cu metallization with PEALD Ru-TiN barrier and ELD seed

System optimization methodology for integrated piezoelectric MEMS resonator biochemical sensors

Latest cluster performance for EUV lithography

Impact of Sn on Ga activation in heteroepitaxial Ge1-xSnx layer

Tailored and tapered metallic gratings for enhanced absorption or transmission

Thin-film solar cells with combined metallic enhancements

Ultra low power litho friendly local assist circuitry for variability resilient 8T SRAM

Advanced 300-mm waferscale patterning for silicon photonics devices with record low loss and phase errors

Si photonic device uniformity improvement using wafer-scale location specific processing

Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopy

Standard cell level parasitics assessment in 20nm BPL and 14nm BFF

Hafnium oxide based CMOS compatible ferroelectric materials

Non-volatile data storage in 28nm ferroelectric FETs

Elemental redistribution of Pt and Pd in nickel silicides: a comparative study

Mixed-mode simulations for power-on ESD analysis

Mixed-mode simulations for power-on ESD analysis

Impact of tester source impedance on HBM failure level

Pitfalls when using the SEED methodology

Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester

Reduction of analogue bandwidth requirement in photonic on-chip reservoir computing