Recently added

High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates

Marcon, Denis; Viaene, John; Van Hove, Marleen; Stoffels, Steve; Decoutere, Stefaan (2012)

Assessment of GaN-on-Si HEMTs for 50V-2GHz RF applications: impact of the RF loss at the buffer/Si interface on the device performance

Marcon, Denis; Viaene, John; Stoffels, Steve; Vanaverbeke, Fre; Kang, Xuanwu; Lenci, Silvia; Srivastava, Puneet; Decoutere, Stefaan (2012)

Manufacturing challenges of GaN-on-Si HEMTs in a 200 mm CMOS fab

Marcon, Denis; De Jaeger, Brice; Halder, Sandip; Vranckx, Nick; Mannaert, Geert; Van Hove, Marleen; Decoutere, Stefaan (2012)

Development of AlGaN recess etch for Emode POWER HEMTs

Mannaert, Geert; Paraschiv, Vasile; De Jaeger, Brice; Van Hove, Marleen; Demand, Marc; Decoutere, Stefaan; Boullart, Werner (2012)

A 52-66GHz subharmonically injection-locked quadrature oscillator with 10GHz locking range in 40nm LP CMOS

Mangraviti, Giovanni; Parvais, Bertrand; Vidojkovic, Vojkan; Vaesen, Kristof; Szortyka, Viki; Khalaf, Khaled; Soens, Charlotte; Vandersteen, Gerd; Wambacq, Piet (2012)

Transfering magnetic vortices between many spin torque oscillators

Manfrini, Mauricio; Kim, Joo-Von; Petit-Watelot, Sebastien; Otxoa, Ruben; Chappert, Claude; Van Roy, Wim; Altimime, Laith; Lagae, Liesbet; Devolder, Thibaut (2012)

A 70dB DR 10b 0-to-80MS/s current integrating SAR ADC with adaptive dynamic range

Malki, Badr; Yamamoto, Takaya; Verbruggen, Bob (2012)

Mid-IR photonic integrated circuits

Malik, Aditya Singh; Roelkens, Gunther (2012)

Wafer level integration of plasmonic nanopore arrays into 200mm CMOS fab environment

Malachowski, Karl; Verbeeck, Rita; Dupont, Tania; Chen, Chang; Stakenborg, Tim; Li, Yi; Sabuncuoglu Tezcan, Deniz; Van Dorpe, Pol (2012)

Wafer scale processing of plasmonic nanopore arrays in 200mm CMOS fab environment

Malachowski, Karl; Verbeeck, Rita; Dupont, Tania; Chen, Chang; Musa, Silke; Li, Yi; Stakenborg, Tim; Sabuncuoglu Tezcan, Deniz; Van Dorpe, Pol (2012)

Wafer scale processing of plasmonic nanoslit arrays in 200mm CMOS fab environment

Malachowski, Karl; Verbeeck, Rita; Dupont, Tania; Chen, Chang; Li, Yi; Musa, Silke; Stakenborg, Tim; Sabuncuoglu Tezcan, Deniz; Van Dorpe, Pol (2012)

Reliability study of reference semiconductor encapsulation materials for biocompatible packaging

Malachowski, Karl; Qian, Karen; Op de Beeck, Maaike; Verbeeck, Rita; Bryce, George; Dekkers, Harold; Sabuncuoglu Tezcan, Deniz (2012)

Silicon micro-pillar filter fabrication for DNA separation in lab-on-chip system

Majeed, Bivragh; Zhang, Lei; Tutunjyan, Nina; Jones, Ben; Sabuncuoglu Tezcan, Deniz; Fiorini, Paolo (2012)

Process integration solution for damage-free bevel for deep Si etch applications

Majeed, Bivragh; Tutunjyan, Nina; Fiorini, Paolo; Sabuncuoglu Tezcan, Deniz (2012)

Image registration software data correction algorithm for a hyperspectral imager

Mainali, Pradip; Lafruit, Gauthier; Shuyang, Liu; Tack, Klaas; Masschelein, Bart; Van Gool, Luc; Lauwereins, Rudy (2012)

3D Mask modeling for EUV lithography

Mailfert, Julien; Zuniga, Christian; Philipsen, Vicky; Adam, Konstantinos; Lam, Michael; Word, James; Hendrickx, Eric; Vandenberghe, Geert; Smith, Bruce (2012)

Total ionizing dose effects on ultra thin buried oxide floating body memories

Mahatme, Nihaar; Schrimpf, Ronald; Reed, Robert; Bhuva, B.L.; Griffoni, Alessio; Simoen, Eddy; Aoulaiche, Marc; Linten, Dimitri; Jurczak, Gosia; Groeseneken, Guido (2012-04)

High efficiency low temperature pre-epi clean method for advanced group IV epi processing

Machkaoutsan, Vladimir; Weeks, Doran; Bauer, Matthias; Maes, Jan; Tolle, John; Thomas, Shawn; Alian, AliReza; Hikavyy, Andriy; Loo, Roger (2012)

High efficiency low temperature pre-epi clean method for advanced group IV epi processing

Machkaoutsan, Vladimir; Weeks, Doran; Bauer, Matthias; Maes, Jan; Tolle, John; Thomas, Shawn; Alian, AliReza; Hikavyy, Andriy; Loo, Roger (2012-09)

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise

Luque Rodriguez, A.; Cano de Andrade, Gloria; Aoulaiche, Marc; Mendes Almeida, Luciano; Claeys, Cor; Jimenez Tejada, J.A.; Jurczak, Gosia; Simoen, Eddy (2012)

Conference contributions: Recent submissions

High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates ﻿

Assessment of GaN-on-Si HEMTs for 50V-2GHz RF applications: impact of the RF loss at the buffer/Si interface on the device performance ﻿

Manufacturing challenges of GaN-on-Si HEMTs in a 200 mm CMOS fab ﻿

Development of AlGaN recess etch for Emode POWER HEMTs ﻿

A 52-66GHz subharmonically injection-locked quadrature oscillator with 10GHz locking range in 40nm LP CMOS ﻿

Transfering magnetic vortices between many spin torque oscillators ﻿

A 70dB DR 10b 0-to-80MS/s current integrating SAR ADC with adaptive dynamic range ﻿

Mid-IR photonic integrated circuits ﻿

Wafer level integration of plasmonic nanopore arrays into 200mm CMOS fab environment ﻿

Wafer scale processing of plasmonic nanopore arrays in 200mm CMOS fab environment ﻿

Wafer scale processing of plasmonic nanoslit arrays in 200mm CMOS fab environment ﻿

Reliability study of reference semiconductor encapsulation materials for biocompatible packaging ﻿

Silicon micro-pillar filter fabrication for DNA separation in lab-on-chip system ﻿

Process integration solution for damage-free bevel for deep Si etch applications ﻿

Image registration software data correction algorithm for a hyperspectral imager ﻿

3D Mask modeling for EUV lithography ﻿

Total ionizing dose effects on ultra thin buried oxide floating body memories ﻿

High efficiency low temperature pre-epi clean method for advanced group IV epi processing ﻿

High efficiency low temperature pre-epi clean method for advanced group IV epi processing ﻿

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise ﻿

High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates

Assessment of GaN-on-Si HEMTs for 50V-2GHz RF applications: impact of the RF loss at the buffer/Si interface on the device performance

Manufacturing challenges of GaN-on-Si HEMTs in a 200 mm CMOS fab

Development of AlGaN recess etch for Emode POWER HEMTs

A 52-66GHz subharmonically injection-locked quadrature oscillator with 10GHz locking range in 40nm LP CMOS

Transfering magnetic vortices between many spin torque oscillators

A 70dB DR 10b 0-to-80MS/s current integrating SAR ADC with adaptive dynamic range

Mid-IR photonic integrated circuits

Wafer level integration of plasmonic nanopore arrays into 200mm CMOS fab environment

Wafer scale processing of plasmonic nanopore arrays in 200mm CMOS fab environment

Wafer scale processing of plasmonic nanoslit arrays in 200mm CMOS fab environment

Reliability study of reference semiconductor encapsulation materials for biocompatible packaging

Silicon micro-pillar filter fabrication for DNA separation in lab-on-chip system

Process integration solution for damage-free bevel for deep Si etch applications

Image registration software data correction algorithm for a hyperspectral imager

3D Mask modeling for EUV lithography

Total ionizing dose effects on ultra thin buried oxide floating body memories

High efficiency low temperature pre-epi clean method for advanced group IV epi processing

High efficiency low temperature pre-epi clean method for advanced group IV epi processing

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise