EISBN
979-8-3503-4630-5
ISSN
1093-0167
Conference
41st IEEE VLSI Test Symposium (VTS)
Journal
2023 IEEE 41st VLSI Test Symposium (VTS)
Title
Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages
Publication type
Proceedings paper
Embargo date
9999-12-31