Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage
View/
open
Published version (5.781Mb)
Metadata
Show full item record
Authors
Diaz Fortuny, Javier
;
Saraza Canflanca, Pablo
;
Bury, Erik
;
Degraeve, Robin
;
Kaczer, Ben
DOI
10.3390/mi15060769
ISSN
2072-666X
PMID
MEDLINE:38930739
Issue
6
Journal
MICROMACHINES
Volume
15
Title
An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage
Publication type
Journal article
Embargo date
2024-06-08
Collections
Articles
Version history
Version
Item
Date
Summary
2
20.500.12860/44119.2
*
2024-09-11T10:21:24Z
validation by library/open access desk
1
20.500.12860/44119
2024-07-04T18:38:13Z
*Selected version
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login