Browsing Articles by imec author "5db00f2cdf2364da0973950b12a7eb65881b07a2"
Now showing items 21-34 of 34
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Mechanical and electrical characterization of BCB as a bond and seal material for cavities housing (RF-) MEMS devices
Jourdain, Anne; De Moor, Piet; Baert, Kris; De Wolf, Ingrid; Tilmans, Harrie (2005-06) -
MEMS packaging and reliability: An undividable couple
Tilmans, Harrie; De Coster, Jeroen; Helin, Philippe; Cherman, Vladimir; Jourdain, Anne; De Moor, Piet; Vandevelde, Bart; Pham, Nga; Zekry, Joseph; Witvrouw, Ann; De Wolf, Ingrid (2012) -
More than just a package - wafer-level packaging of MEMS
Baert, Kris; De Moor, Piet; Tilmans, Harrie; John, Joachim; Witvrouw, Ann; Van Hoof, Chris; Beyne, Eric (2004-06) -
Novel technology for microlenses for imaging
Motsnyi, Vasyl; De Wolf, Ingrid; Rochus, Veronique; Rottenberg, Xavier; Cangar, Ozlem; Van Olmen, Jan; Guerrieri, Stefano; De Moor, Piet; Zahir, Mustapha (2018) -
On the processing aspects of high performance hybrid backside
De Vos, Joeri; De Munck, Koen; Minoglou, Kiki; Ramachandra Rao, Padmakumar; Erismis, Mehmet Akif; De Moor, Piet; Sabuncuoglu Tezcan, Deniz (2011) -
Photoresist coating and patterning for through-silicon via technology
Pham, Nga; Sabuncuoglu Tezcan, Deniz; Ruythooren, Wouter; De Moor, Piet; Majeed, Bivragh; Baert, Kris; Swinnen, Bart (2008) -
Precision particle spectroscopy with microcalorimeters in magnetic fields
De Moor, Piet; Belmans, Wouter; Baert, Kris; Van Hoof, Chris; Verbist, Agnes; Oberstedt, A.; Vanneste, L. (2000) -
Rückseitig belichtete CMOS Bildsensoren für höhere Empfindlichkeit
Provoost, Jan; De Moor, Piet (2012-01) -
Stress analysis on ultra thin ground wafers
Cotrin Teixeira, Ricardo; De Munck, Koen; De Moor, Piet; Baert, Kris; Swinnen, Bart; Van Hoof, Chris; Knüttel, Alexander (2008) -
Submicron micromachining technology for liquid phase chromatography separation
De Moor, Piet; Sabuncuoglu Tezcan, Deniz; De Malsche, Wim; Vangelooven, Joris; Desmet, Geert (2008) -
The RELAXd project: Development of four-side tilable photon-counting imagers
Vykydal, Zdenek; Visschers, Jan; Sabuncuoglu Tezcan, Deniz; De Munck, Koen; Borgers, Tom; Ruythooren, Wouter; De Moor, Piet (2008) -
Trends beim Einbau von MEMS auf Wafer-Ebene
Baert, Kris; De Moor, Piet; Tilmans, Harrie; John, Joachim; Witvrouw, Ann; Van Hoof, Chris; Beyne, Eric; Van Bavel, Mieke (2003-11) -
Trends in wafer-level packaging of MEMS
Baert, Kris; De Moor, Piet; Tilmans, Harrie; John, Joachim; Witvrouw, Ann; Van Hoof, Chris; Beyne, Eric; Van Bavel, Mieke (2003-10) -
Why CMOS-integrated transducers? A review.
Witvrouw, Ann; Van Steenkiste, Filip; Maes, Deirdre; Haspeslagh, Luc; Laureyn, Wim; Van Gerwen, Peter; De Moor, Piet; Sedky, Sherif; Van Hoof, Chris; De Vries, Atze; De Caussemaker, A.; Parmentier, Brigitte; Baert, Kris (2000)