Browsing Articles by imec author "b2d58ce7bd37aa8d6398218af9a9f2fc59b205e7"
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3D analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artefacts
Ke, Xiaoxing; Bals, Sarah; Cott, Daire; Hantschel, Thomas; Bender, Hugo; Van Tendeloo, Gustaaf (2010) -
A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
Schulze, Andreas; Verhulst, Anne; Nazir, Aftab; Hantschel, Thomas; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Advanced Raman spectroscopy using nanofocusing of light
Nuytten, Thomas; Bogdanowicz, Janusz; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2017) -
Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon
Eyben, Pierre; Clemente, Francesca; Vanstreels, Kris; Pourtois, Geoffrey; Sankaran, Kiroubanand; Clarysse, Trudo; Mody, Jay; Duriau, Edouard; Hantschel, Thomas; Vandervorst, Wilfried; Mylvaganam, Kausala; Zhang, Liangchi (2010) -
Anisotropic etching of inverted pyramids in the sub-100 nm region
Hantschel, Thomas; Vandervorst, Wilfried (1997) -
Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy
Nuytten, Thomas; Bogdanowicz, Janusz; Witters, Liesbeth; Eneman, Geert; Hantschel, Thomas; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2018) -
Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations
Han, Han; Hantschel, Thomas; Strakos, Libor; Vystavel, Tomas; Baryshnikova, Marina; Mols, Yves; Kunert, Bernardette; Langer, Robert; Vandervorst, Wilfried; Caymax, Matty (2020) -
Carbon nanotube growth for through-silicon via applications
Xie, Rongsie; Zhang, Can; van der Veen, Marleen; Arstila, Kai; Hantschel, Thomas; Chen, Bingan; Zhong, Guofang; Robertson, John (2013) -
Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Wouters, Lennaert; Minj, Albert; Celano, Umberto; Hantschel, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2020) -
Conductive diamond probes with electroplated holder chips
Koelling, Sebastian; Hantschel, Thomas; Vandervorst, Wilfried (2007) -
Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures
Hantschel, Thomas; Demeulemeester, Cindy; Eyben, Pierre; Schulz, Volker; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009) -
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism
Serron, Jill; Minj, Albert; Spampinato, Valentina; Franquet, Alexis; Rybalchenko, Yevhenii; Boulon, Marie-Emmanuelle; Brems, Steven; Shi, Yuanyuan; Groven, Benjamin; Villarreal, Renan; Conard, Thierry; van der Heide, Paul; Hantschel, Thomas; Medina Silva, Henry (2023-05-17) -
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
Spampinato, Valentina; Shi, Yuanyuan; Serron, Jill; Minj, Albert; Groven, Benjamin; Hantschel, Thomas; van der Heide, Paul; Franquet, Alexis (2023) -
Correlating Structural and Electrical Characteristics of Threading Dislocations in GaN-on-Si Heterostructures and p-n Diodes by Multiple Microscopy Techniques
Minj, Albert; Geens, Karen; Liang, Hu; Han, Han; Noel, Celine; Bakeroot, Benoit; Paredis, Kristof; Zhao, Ming; Hantschel, Thomas; Decoutere, Stefaan (2023) -
Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM
Han, Han; Strakos, Libor; Hantschel, Thomas; Vystavel, Tomas; Porret, Clément; Loo, Roger; Caymax, Matty (2021) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011) -
Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013) -
Diamond nano-particle seeding for tip moulding application
Tsigkourakos, Menelaos; Hantschel, Thomas; Arstila, Kai; Vandervorst, Wilfried (2013) -
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Zha, Lichen; Nuytten, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2016) -
Diamond tips and cantilevers for the characterization of semiconductor devices
Malavé, A.; Oesterschulze, E.; Kulisch, W.; Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried (1999)