Browsing Articles by imec author "fd3930f7eb72d06dd561a45f72c18b5e5b997c0c"
Now showing items 61-80 of 150
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High-performance strained Si/SiGe pMOS devices with multiple quantum wells
Collaert, Nadine; Verheyen, Peter; De Meyer, Kristin; Loo, Roger; Caymax, Matty (2002) -
Impact of donor concentration, electric field, and temperature effects on the leakage current in germanium p+/n junctions
Eneman, Geert; Wiot, Maxime; Brugere, Antoine; Sicart i Casain, Oriol; Sonde, Sushant; Brunco, David; De Jaeger, Brice; Satta, Alessandra; Hellings, Geert; De Meyer, Kristin; Claeys, Cor; Meuris, Marc; Heyns, Marc; Simoen, Eddy (2008) -
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures
Benbakhti, Brahim; Ayubi-Moak, J.S.; Kalna, Karol; Lin, Dennis; Hellings, Geert; Brammertz, Guy; De Meyer, Kristin; Thayne, I.; Asenov, Asen (2010) -
Impact of LER and random dopant fluctuations on FinFET matching performance
Baravelli, Emanuele; Jurczak, Gosia; Speciale, N.; De Meyer, Kristin; Dixit, Abhisek (2008) -
Impact of line-edge roughness on FinFET matching performance
Baravelli, Emanuele; Dixit, Abhisek; Rooyackers, Rita; Jurczak, Gosia; Speciale, Nicolo; De Meyer, Kristin (2007) -
Impact of starting measurement voltage relative to flat-band voltage position on the capacitance-voltage hysteresis and on the defect characterization of InGaAs/high-k metal-oxide-semiconductor stacks
Vais, Abhitosh; Franco, Jacopo; Lin, Dennis; Collaert, Nadine; Mocuta, Anda; De Meyer, Kristin; Thean, Aaron (2015) -
Improved ohmic performance by the metallic bilayer contact stack of oxygen-incorporated La/ultrathin TiSi on n-Si
Wang, Linlin; Yu, Hao; Schaekers, Marc; Everaert, Jean-Luc; Mocuta, Dan; Horiguchi, Naoto; Collaert, Nadine; De Meyer, Kristin; Jiang, Yu-long (2018) -
Influence of dislocations in strained Si/relaxed SiGe layers on n/p-junctions in a metal-oxide-semiconductor field-effect transistor technology
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Verheyen, Peter; Loo, Roger; De Meyer, Kristin (2005-11) -
Influence of metal capping layer on the work function of Mo gated metal-oxide semiconductor stacks
Li, Zilan; Schram, Tom; Stesmans, Andre; Franquet, Alexis; Witters, Thomas; Pantisano, Luigi; Yamada, Naoki; Tsunoda, Takaaki; Hooker, Jacob; De Gendt, Stefan; De Meyer, Kristin (2008) -
Interface stability in advanced high-k-metal-gate stacks
Adelmann, Christoph; Franquet, Alexis; Conard, Thierry; Witters, Thomas; Ferain, Isabelle; Meersschaut, Johan; Jurczak, Gosia; De Meyer, Kristin; Kittl, Jorge; Van Elshocht, Sven (2009) -
Investigation on molybdenum and its conductive oxides as p-type metal gate candidates
Li, Zilan; Schram, Tom; Witters, Thomas; Cho, Hag-Ju; O'Sullivan, Barry; Yamada, Naoki; Tsunoda, Takaaki; Hooker, Jacob; De Gendt, Stefan; De Meyer, Kristin (2008) -
Lanthanum and lanthanum silicide contacts on N-Type silicon
Yu, Hao; Wang, Linlin; Schaekers, Marc; Everaert, Jean-Luc; Jiang, Yu-Long; Mocuta, Dan; Horiguchi, Naoto; Collaert, Nadine; De Meyer, Kristin (2017) -
Limitations of shift-and-ratio based Leff extraction techniques for MOS transistors with halo or pocket implants
van Meer, Hans; Henson, Kirklen; Lyu, Jeong-ho; Rosmeulen, Maarten; Kubicek, Stefan; Collaert, Nadine; De Meyer, Kristin (2000) -
Low-resistance titanium contacts and thermally unstable nickel germanide contacts on p-type germanium
Yu, Hao; Schaekers, Marc; Schram, Tom; Aderhold, Wolfgang; Mayur, Abilash; Mitard, Jerome; Witters, Liesbeth; Barla, Kathy; Collaert, Nadine; Horiguchi, Naoto; Thean, Aaron; De Meyer, Kristin (2016) -
Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks
Li, Zilan; Schram, Tom; Pantisano, Luigi; Stesmans, Andre; Conard, Thierry; Shamuilia, Sheron; Afanasiev, Valeri; Akheyar, Amal; Van Elshocht, Sven; Brunco, David; Deweerd, Wim; Naoki, Yamada; Lehnen, Peer; De Gendt, Stefan; De Meyer, Kristin (2007) -
Methodology for flatband voltage measurement in fully depleted floating-body FinFETs
Ferain, Isabelle; Pantisano, Luigi; O'Sullivan, Barry; Singanamalla, Raghunath; Collaert, Nadine; Jurczak, Gosia; De Meyer, Kristin (2008) -
Modeling of uniform switching RRAM devices and impact of critical defects
Subhechha, Subhali; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar (2017) -
Modeling the impact of junction angles in tunnel field-effect transistors
Kao, Frank; Verhulst, Anne; Vandenberghe, William; Soree, Bart; Groeseneken, Guido; De Meyer, Kristin (2012) -
Modeling the short-channel threshold voltage of a novel vertical heterojunction pMOSFET
Collaert, Nadine; De Meyer, Kristin (1999) -
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance
Lujan, Guilherme; Magnus, Wim; Ragnarsson, Lars-Ake; Kubicek, Stefan; De Gendt, Stefan; Heyns, Marc; De Meyer, Kristin (2005)