Browsing Presentations by imec author "df5489fddcf1483b5d3723d69fd7de11fc8ff7f0"
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Advanced CMOS devices and reliability (tutorial)
Kaczer, Ben (2012) -
Advanced experimental techniques for BTI characterization (tutorial)
Kaczer, Ben (2012) -
Advanced experimental techniques for BTI characterization (tutorial)
Kaczer, Ben (2012) -
ALD strontium titanates and their characterization
Popovici, Mihaela Ioana; Van Elshocht, Sven; Tomida, Kazuyuki; Menou, Nicolas; Swerts, Johan; Pawlak, Malgorzata; Kaczer, Ben; Kim, Min-Soo; Brijs, Bert; Favia, Paola; Conard, Thierry; Franquet, Alexis; Moussa, Alain; Debusschere, Ingrid; Altimime, Laith; Kittl, Jorge (2010) -
Atomic layer deposition as an enabling technology for fabrication of germanium MOS transistor
Eneman, Geert; Delabie, Annelies; Van Elshocht, Sven; De Jaeger, Brice; Nicholas, Gareth; Martens, Koen; Brunco, David; Zimmerman, Paul; Houssa, Michel; Pourtois, Geoffrey; Kaczer, Ben; Leys, Frederik; Winderickx, Gillis; Huyghebaert, Cedric; Terzieva, Valentina; Loo, Roger; Caymax, Matty; Meuris, Marc; Heyns, Marc (2007) -
Charge pumping characterization of germanium MOSFETs
Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007) -
Deposition of SBT and PZT thin films for FERAM application
Everaerts, Jurgen; Johnson, Jo; Bartic, Andrei; Kaczer, Ben; Lisoni, Judit; Vander Meeren, Hans; Wouters, D. (2001) -
Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers
Houssa, Michel; Degraeve, Robin; Heyns, Marc; Kaczer, Ben; Groeseneken, Guido; Naili, Mohamed; Mertens, Paul; Stesmans, Andre; Jeon, J. S.; Halliyal, A. (2000) -
Electron energy dependence of defect generation in high-k gate stacks
O'Connor, Robert; Pantisano, Luigi; Degraeve, Robin; Kauerauf, Thomas; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido (2007) -
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Croon, Jeroen; Kaczer, Ben; Lujan, Guilherme; Kubicek, Stefan; Groeseneken, Guido; Meuris, Marc (2004) -
Ferroelectric properties and reliability of sidewall SBT in integrated 3D FeCAPs
Goux, Ludovic; Menou, N.; Lisoni, Judit; Schwitters, M.; Paraschiv, Vasile; Maes, David; Zhen, X.; Kaczer, Ben; Haspeslagh, Luc; Wouters, Dirk; Muller, C.; Caputa, C.; Zambrano, R. (2004) -
Gate oxide breakdown in FET devices and circuits (Tutorial)
Kaczer, Ben (2009) -
Ge and III/V: the CMOS of the future
Heyns, Marc; Adelmann, Christoph; Bellenger, Florence; Brammertz, Guy; Brunco, David; Caymax, Matty; De Jaeger, Brice; Delabie, Annelies; Eneman, Geert; Houssa, Michel; Kaczer, Ben; Lin, Dennis; Martens, Koen; Meuris, Marc; Mitard, Jerome; Opsomer, Karl; Pourtois, Geoffrey; Satta, Alessandra; Scarrozza, Marco; Simoen, Eddy; Sioncke, Sonja; Souriau, Laurent; Terzieva, Valentina; Van Elshocht, Sven (2007) -
Impact of halo implant on the hot carrier reliability of germanium pMOSFETs
Franco, Jacopo; Eneman, Geert; Kaczer, Ben; Mitard, Jerome; Groeseneken, Guido (2010) -
Impact of nitridation on recoverable and permanent NBTI degradation in high-k/metal-gate pMOSFETs
Aoulaiche, Marc; Kaczer, Ben; Roussel, Philippe; Houssa, Michel; De Gendt, Stefan; Maes, Herman; Groeseneken, Guido (2008) -
Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001) -
Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Groeseneken, Guido; Degraeve, Robin; Kaczer, Ben (1999) -
Impact of the hard breakdown detection method on the extraction of the Wearout distribution parameters
Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido (2007) -
Investigation of bias-temperature instability in work-function-tuned high-k/metal-gate stacks
Kaczer, Ben; Veloso, Anabela; Roussel, Philippe; Grasser, Tibor; Groeseneken, Guido (2008) -
Investigation of properties of SiO2 defects created during electric stressing at different temperatures
Kaczer, Ben; Degraeve, Robin; Pangon, Nadège; Groeseneken, Guido (1999)