Browsing by Author "Alles, Michael L."
- Results Per Page
- Sort Options
Publication 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs
Publication Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
Publication Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
Proceedings paper2011, European Conference on Radiation Effects on Component and Systems - RADECS, 19/09/2011, p.195-201Publication Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
Publication Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Journal article2023, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (70) 4, p.442-448Publication Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs
Publication Total-dose response of HfO2/Hf-based bipolar resistive memories
Publication Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices