Browsing by Author "Capuz, Giovanni"
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Publication 10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622Publication 3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement
Proceedings paper2016, IEEE 18th Electronic Packaging Technology Conference - EPTC, 30/11/2016, p.791-796Publication 3D IC process development for enabling chip-on-chip and chip on wafer multi-stacking at assembly
Meeting abstract2015, International Conference on Electronic Packaging & iMAPS All Asia Conference - ICEP-IACC, 14/04/2015, p.56-60Publication 3D stacking using bump-less process for sub 10μm pitches
Proceedings paper2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133Publication A novel intermetallic compound insertion bonding to improve throughput for 3D die to wafer stacking
Proceedings paper2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 26/05/2020Publication A novel intermetallic compound insertion bonding to improve throughput for sequential 3D stacking
Journal article2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 4, p.669-678Publication A novel iso-thermal intermetallic compound insertion bonding approach to improve throughput for 3D die to wafer stacking
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1442-1447Publication A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly
Meeting abstract2020, IMAPS 53rd International Symposium on Microelectronics, 6/10/2020Publication A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps
Proceedings paper2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124Publication An alternative 3D packaging route thru wafer reconstruction
Proceedings paper2015, 17th Electronic Packaging Technology Conference - EPTC, 2/12/2015, p.1-5Publication Challenges and solutions on pre-assembly processes for thinned 3D wafers with micro-bumps on the backside
Proceedings paper2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.75-79Publication Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills
; ;Wang, Teng; ; ; Meeting abstract2015, 17th Electronics Packaging Technology Conference - EPTC, 2/12/2015Publication Confined IMCs for low temperature and high throughput D2W bonding
Proceedings paper2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.131-132Publication Cu-Cu insertion bonding technique using photosensitive polymer as WLUF
Proceedings paper2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.313-317Publication Developing underfill process in screening of no-flow underfill and wafer-applied underfill materials for 3D stacking
; ; ;Daily, Robert; ; Wang, TengProceedings paper2013, 15th Electronics Packaging Technology Conference - EPTC, 11/12/2013, p.124-129Publication Development of underfilling and thermo-compression bonding processes for stacking multi-layer 3D ICs
Proceedings paper2014, 5th Electronics System-Integration Technology Conference - ESTC, 16/09/2014, p.1-5Publication Die to wafer 3D stacking for below 10μm pitch microbumps
Proceedings paper2016, IEEE International Conference on 3D System Integration - 3DIC, 9/11/2016, p.1-4Publication Exploring process interaction of no-flow underfill and thermo-compression bonding in D2D stacking
Meeting abstract2013, International Wafer-Level Packaging Conference - IWLPC, 5/11/2013Publication Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking
Proceedings paper2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.1108-1113Publication Low warpage wafer level transfer molding post 3D die to wafer assembly
Proceedings paper2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.843-848