Repository logo Institutional repository
  • Communities & Collections
  • Scientific publicationsOpen knowledge
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Capuz, Giovanni"

Filter results by typing the first few letters
Now showing 1 - 20 of 34
  • Results per page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

    Derakhshandeh, Jaber  
    ;
    Capuz, Giovanni  
    ;
    Cherman, Vladimir  
    ;
    Inoue, Fumihiro  
    ;
    De Preter, Inge  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622
  • Loading...
    Thumbnail Image
    Publication

    3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement

    Wang, Teng
    ;
    Bex, Pieter  
    ;
    Capuz, Giovanni  
    ;
    Duval, Fabrice  
    ;
    Inoue, Fumihiro  
    ;
    Gerets, Carine  
    Proceedings paper
    2016, IEEE 18th Electronic Packaging Technology Conference - EPTC, 30/11/2016, p.791-796
  • Loading...
    Thumbnail Image
    Publication

    3D IC process development for enabling chip-on-chip and chip on wafer multi-stacking at assembly

    Daily, Robert
    ;
    Capuz, Giovanni  
    ;
    Wang, Teng
    ;
    Bex, Pieter  
    ;
    Struyf, Herbert  
    ;
    Sleeckx, Erik  
    Meeting abstract
    2015, International Conference on Electronic Packaging & iMAPS All Asia Conference - ICEP-IACC, 14/04/2015, p.56-60
  • Loading...
    Thumbnail Image
    Publication

    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
    ;
    De Preter, Inge  
    ;
    Gerets, Carine  
    ;
    Hou, Lin  
    ;
    Heylen, Nancy  
    ;
    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
  • Loading...
    Thumbnail Image
    Publication

    A novel intermetallic compound insertion bonding to improve throughput for 3D die to wafer stacking

    Hou, Lin  
    ;
    Derakhshandeh, Jaber  
    ;
    Capuz, Giovanni  
    ;
    Lofrano, Melina  
    ;
    Beyne, Eric  
    ;
    Miller, Andy  
    Proceedings paper
    2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 26/05/2020
  • Loading...
    Thumbnail Image
    Publication

    A novel intermetallic compound insertion bonding to improve throughput for sequential 3D stacking

    Hou, Lin  
    ;
    Derakhshandeh, Jaber  
    ;
    Capuz, Giovanni  
    ;
    Beyne, Eric  
    ;
    De Wolf, Ingrid  
    Journal article
    2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 4, p.669-678
  • Loading...
    Thumbnail Image
    Publication

    A novel iso-thermal intermetallic compound insertion bonding approach to improve throughput for 3D die to wafer stacking

    Hou, Lin  
    ;
    Derakhshandeh, Jaber
    ;
    Capuz, Giovanni
    ;
    Lofrano, Melina
    ;
    Beyne, Eric
    ;
    Miller, Andy
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1442-1447
  • Loading...
    Thumbnail Image
    Publication

    A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly

    Capuz, Giovanni  
    ;
    Lofrano, Melina  
    ;
    Gerets, Carine  
    ;
    Duval, Fabrice  
    ;
    Bex, Pieter  
    Meeting abstract
    2020, IMAPS 53rd International Symposium on Microelectronics, 6/10/2020
  • Loading...
    Thumbnail Image
    Publication

    A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps

    Derakhshandeh, Jaber  
    ;
    Gerets, Carine  
    ;
    Inoue, Fumihiro  
    ;
    Capuz, Giovanni  
    ;
    Cherman, Vladimir  
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124
  • Loading...
    Thumbnail Image
    Publication

    An alternative 3D packaging route thru wafer reconstruction

    Cadacio Jr., Francisco
    ;
    Wang, Teng
    ;
    Salahouelhadj, Abdellah  
    ;
    Capuz, Giovanni  
    ;
    Gerets, Carine  
    Proceedings paper
    2015, 17th Electronic Packaging Technology Conference - EPTC, 2/12/2015, p.1-5
  • Loading...
    Thumbnail Image
    Publication

    Challenges and solutions on pre-assembly processes for thinned 3D wafers with micro-bumps on the backside

    Podpod, Arnita  
    ;
    Demeurisse, Caroline  
    ;
    Rebibis, Kenneth June  
    ;
    Gerets, Carine  
    Proceedings paper
    2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.75-79
  • Loading...
    Thumbnail Image
    Publication

    Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills

    Duval, Fabrice  
    ;
    Wang, Teng
    ;
    Capuz, Giovanni  
    ;
    Gerets, Carine  
    ;
    Miller, Andy  
    ;
    Rebibis, Kenneth June  
    Meeting abstract
    2015, 17th Electronics Packaging Technology Conference - EPTC, 2/12/2015
  • Loading...
    Thumbnail Image
    Publication

    Confined IMCs for low temperature and high throughput D2W bonding

    Derakhshandeh, Jaber  
    ;
    La Tulipe, Douglas Charles  
    ;
    Capuz, Giovanni  
    ;
    Cherman, Vladimir  
    Proceedings paper
    2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.131-132
  • Loading...
    Thumbnail Image
    Publication

    Cu-Cu insertion bonding technique using photosensitive polymer as WLUF

    Potoms, Goedele  
    ;
    Wang, Teng
    ;
    Derakhshandeh, Jaber  
    ;
    Daily, Robert
    ;
    Capuz, Giovanni  
    Proceedings paper
    2014, 16th IEEE Electronic Packaging Technology Conference - EPTC, 3/12/2014, p.313-317
  • Loading...
    Thumbnail Image
    Publication

    Developing underfill process in screening of no-flow underfill and wafer-applied underfill materials for 3D stacking

    Rebibis, Kenneth June  
    ;
    Capuz, Giovanni  
    ;
    Daily, Robert
    ;
    Gerets, Carine  
    ;
    Duval, Fabrice  
    ;
    Wang, Teng
    Proceedings paper
    2013, 15th Electronics Packaging Technology Conference - EPTC, 11/12/2013, p.124-129
  • Loading...
    Thumbnail Image
    Publication

    Development of underfilling and thermo-compression bonding processes for stacking multi-layer 3D ICs

    Wang, Teng
    ;
    Daily, Robert
    ;
    Capuz, Giovanni  
    ;
    Gerets, Carine  
    ;
    Rebibis, Kenneth June  
    ;
    Miller, Andy  
    Proceedings paper
    2014, 5th Electronics System-Integration Technology Conference - ESTC, 16/09/2014, p.1-5
  • Loading...
    Thumbnail Image
    Publication

    Die to wafer 3D stacking for below 10μm pitch microbumps

    Derakhshandeh, Jaber  
    ;
    Hou, Lin  
    ;
    De Preter, Inge  
    ;
    Gerets, Carine  
    ;
    Suhard, Samuel  
    ;
    Dubey, Vikas
    Proceedings paper
    2016, IEEE International Conference on 3D System Integration - 3DIC, 9/11/2016, p.1-4
  • Loading...
    Thumbnail Image
    Publication

    Exploring process interaction of no-flow underfill and thermo-compression bonding in D2D stacking

    Capuz, Giovanni  
    ;
    Daily, Robert
    ;
    Wang, Teng
    ;
    Struyf, Herbert  
    ;
    Miller, Andy  
    ;
    Rebibis, Kenneth June  
    Meeting abstract
    2013, International Wafer-Level Packaging Conference - IWLPC, 5/11/2013
  • Loading...
    Thumbnail Image
    Publication

    Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking

    Derakhshandeh, Jaber  
    ;
    Beyne, Eric  
    ;
    Beyer, Gerald  
    ;
    Capuz, Giovanni  
    ;
    Cherman, Vladimir  
    Proceedings paper
    2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.1108-1113
  • Loading...
    Thumbnail Image
    Publication

    Low warpage wafer level transfer molding post 3D die to wafer assembly

    Cadacio Jr., Francisco
    ;
    Wang, Teng
    ;
    Salahouelhadj, Abdellah  
    ;
    Capuz, Giovanni  
    ;
    Potoms, Goedele  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.843-848
  • «
  • 1 (current)
  • 2
  • »

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings