Browsing by Author "Carin, R."
- Results Per Page
- Sort Options
Publication Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Proceedings paper2011, 21st International Conference on Noise and Fluctuations - ICNF, 12/06/2011, p.131-134Publication DC and noise performances of SOI FinFETs at very low temperature
Proceedings paper2012, 8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 24/01/2012, p.13-14Publication High-temperature characterization of advanced strained nMUGFETs
; ; Publication Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Oral presentation2008, Workshop 'Oxydes Fonctionnels pour l'Intégration en Micro- et Nano-électronique'Publication Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
Journal article2015, Solid-State Electronics, 112, p.1-6Publication Impact of strain and source/drain engineering on the low-frequency noise behaviour in n-channel Tri-Gate FinFETs
; ; ; Journal article2008, Solid-State Electronics, (52) 12, p.1889-1894Publication Low frequency noise characterization in n-channel FinFETs
Journal article2012, Solid-State Electronics, (70) 1, p.20-26Publication Low frequency noise spectroscopy in advanced nFinFETs
Proceedings paper2011, 7th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 17/01/2011, p.55-56Publication Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Journal article2007, Journal of Applied Physics, (101) 10, p.104511Publication Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs
Proceedings paper2003, Proceedings of the 17th International Conference on Noise and Fluctuations - ICNF, 18/08/2003, p.763-766Publication Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Journal article2007, IEEE Electron Device Letters, (28) 4, p.288-291Publication Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Proceedings paper2007, Noise and Fluctuations: 19th International Conference, 9/09/2007, p.29-32Publication Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Proceedings paper2009, 20th International Conference on Noise and Fluctuations - ICNF, 14/06/2009, p.298-298Publication Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
Oral presentation2002, E-MRS Spring Meeting Symposium K: Thin Film Materials for Large-Area ElectronicsPublication Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
Proceedings paper2015, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS, 26/01/2015, p.237-240Publication Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
Journal article2007, Solid-State Electronics, (51) 9, p.1180-1184Publication Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques
; ; ; Proceedings paper2008, EUROSOI Workshop Proceedings: 4th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits, 23/01/2008, p.141-142