Browsing by Author "Chintala, Ravi Chandra"
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Publication A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Meeting abstract2015, 2015 MRS Fall Meeting symposium UU:, 29/11/2015, p.UU8.05Publication A novel approach of using STM and NC-AFM to study narrow trenches in an oxide matrix
Meeting abstract2014, 17th International Conference on Non-Contact Atomic Force Microscopy - NC-AFM, 4/08/2014, p.PT28Publication Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM
Meeting abstract2014, MRS Spring Meeting Symposium BBB: Advances in Scanning Probe Microscopy for Material Properties, 21/04/2014, p.BBB3.01Publication Characterization of organic materials using scanning probe microscopy techniques
Chintala, Ravi ChandraPHD thesis2017-05Publication Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy
Oral presentation2013, Forum des Microscopies a Sonde LocalePublication Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM
Oral presentation2013, SPM Dutch User Meeting 2013Publication Electrical properties of amino SAM layers studied with conductive AFM
Journal article2013, European Polymer Journal, (49) 8, p.1952-1956Publication Electrical properties of APTMS SAM layers studied with conductive atomic force microscope
Oral presentation2012, International Conference on Scanning Probe Microscopy on Soft and Polymeric MaterialsPublication Evaluation of the electrical contact area in contact-mode scanning probe microscopy
Journal article2015, Journal of Applied Physics, (117) 21, p.214305Publication Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy
Journal article2016, Nanoscale, (8) 6, p.3629-3637Publication Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography
Journal article2019, AIP Advances, (9) 2, p.25105Publication Nanoscale characterization of polymer: fullerene solar cells using peak force tunneling AFM technique
Oral presentation2013, 5th International Conference on Hybrid and Organic PhotovoltaicsPublication Sacrificial self-assembled monolayers for the passivation of GaAs (100) surfaces and interfaces
Journal article2016, Chemistry of Materials, (28) 16, p.5689-5701Publication Surface characterization of InP trenches embedded in oxide using scanning probe microscopy
Journal article2015, Journal of Applied Physics, (118) 22, p.225304Publication The unexpected effects of crystallization on Ta2O5 as studied by HRTEM and C-AFM
Journal article2013-04, Microelectronic Engineering, 109, p.318-321Publication The unexpected effects of crystallization on Ta2O5 as studied by HRTEM and C-AFM
Proceedings paper2013, 18th Conference of Insulting Films on Semiconductors - INFOS: Book of Abstracts, 25/06/2013, p.152-153Publication Thermal degradation study of P3HT:PCBM solar cells using SPM techniques
Oral presentation2014, E-MRS Spring Meeting Symposium H: Analytical Techniques for Precise Characterization of Nanomaterials - ALTECH