Browsing by Author "Cretu, Bogdan"
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Publication A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Proceedings paper2013, International Conference on 1/f Noise and Fluctuations - ICNF, 24/06/2013, p.1-4Publication Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Journal article2016, Semiconductor Science and Technology, (31) 12, p.124006Publication DC and low frequency noise performances of SOI p-FinFETs at very low temperature
Publication Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
Journal article2018, Solid-State Electronics, 143, p.27-32Publication Discussion of the flicker noise origin at very low temperature and polarization operation
Proceedings paper2019, 25th Int. Conf on Noise and 1/f Fluctuations, 18/06/2019, p.45-48Publication Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures
Proceedings paper2018, Joint International EUROSOI Workshop and International Conference on Ultimate Silicon Integration- EUROSOI-ULIS, 19/03/2018, p.1-4Publication Discussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities
Proceedings paper2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.45-51Publication Impact of defects on transport in nanodevices
Meeting abstract2018-06, E-MRS Spring Meeting Symposium G: Carrier Transport, Photonics and Sensing in Group IV-based and Other Semiconductors ..., 18/06/2018, p.G.8.6Publication Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization
Journal article2020, Solid-State Electronics, 171, p.107771Publication In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Publication Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs
Proceedings paper2013, Advanced Semiconductor-on-Insulator Technology and Related Physics 16, 12/05/2013, p.49-61Publication Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
Publication Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Journal article2020, Solid-State Electronics, 168, p.107732Publication Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Proceedings paper2019, 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 1/04/2019Publication Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
Journal article2017, Solid-State Electronics, (128) 1, p.102-108Publication Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs
Proceedings paper2015, International Conference on Noise and Fluctuations - ICNF, 1/06/2015, p.1-4Publication Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets
Proceedings paper2021, Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), SEP 01-03, 2021Publication Low temperature noise spectroscopy of p-channel SOI FinFETs
Proceedings paper2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 26/01/2014, p.1-2Publication Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Publication Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs
Proceedings paper2016, Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - ULIS, 25/01/2016