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Browsing by Author "Derakhshandeh, Jaber"

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    10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
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    Inoue, Fumihiro  
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    De Preter, Inge  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622
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    20 μm pitch Cu-to-Cu flip-chip interconnects through Cu nanoparticles sintering

    Ji, Xinrui
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    Du, Leiming
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    van Zeijl, Henk
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    Zhang, Guoqi
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    Derakhshandeh, Jaber  
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    Beyne, Eric  
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.1891-1895
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    3D interconnects for quantum computing

    Derakhshandeh, Jaber  
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    Dangol, Anish  
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    Hussain, Tassawar  
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    Stegmann, Heiko
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.821-828
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    3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Nagano, Fuya  
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    Houshmand Sharifi, Shamin  
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    Hou, Lin  
    Proceedings paper
    2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3
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    3D stacking of Co and Ni based microbumps

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Gerets, Carine  
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    Wang, Teng
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Gerets, Carine  
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    Hou, Lin  
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    Heylen, Nancy  
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    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
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    A novel in-situ resistance measurement to extract IMC resistivity and kinetic parameter for CoSn 3D stacks

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    De Coster, Jeroen  
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    Wang, Teng
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    Cherman, Vladimir  
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    Bex, Pieter  
    Proceedings paper
    2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.7.4
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    A novel intermetallic compound insertion bonding to improve throughput for 3D die to wafer stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Lofrano, Melina  
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    Beyne, Eric  
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    Miller, Andy  
    Proceedings paper
    2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 26/05/2020
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    A novel intermetallic compound insertion bonding to improve throughput for sequential 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Beyne, Eric  
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    De Wolf, Ingrid  
    Journal article
    2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 4, p.669-678
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    A novel iso-thermal intermetallic compound insertion bonding approach to improve throughput for 3D die to wafer stacking

    Hou, Lin  
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    Derakhshandeh, Jaber
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    Capuz, Giovanni
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    Lofrano, Melina
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    Beyne, Eric
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    Miller, Andy
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1442-1447
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    A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly

    Capuz, Giovanni  
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    Lofrano, Melina  
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    Gerets, Carine  
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    Duval, Fabrice  
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    Bex, Pieter  
    Meeting abstract
    2020, IMAPS 53rd International Symposium on Microelectronics, 6/10/2020
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    A novel resistance measurement methodology for in-situ UBM/Solder interfacial reaction monitoring

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Beyne, Eric  
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    De Wolf, Ingrid  
    Journal article
    2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 1, p.30-38
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    A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps

    Derakhshandeh, Jaber  
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    Gerets, Carine  
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    Inoue, Fumihiro  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124
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    An in-situ resistance measurement to extract IMC resistivity and kinetic parameter of alternative metallurgies for 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    Radisic, Alex  
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    Honore, Mia
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    De Coster, Jeroen  
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    Cherman, Vladimir  
    Proceedings paper
    2018, 7th Electronic System-Integration Technology Conference - ESTC, 18/09/2018, p.1-8
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    An Investigation on Particle Embedding Capability of Wafer Level Spin-on Polymer Underfill Enabling Low Temperature Bonding of Hybrid Bonding Sysem

    Noda, Hiroto
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    Hiro, Akito
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    Nishiguchi, Naoki
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    Derakhshandeh, Jaber  
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    Slabbekoorn, John  
    Proceedings paper
    2023, IEEE 73rd Electronic Components and Technology Conference (ECTC), MAY 30-JUN 02, 2023, p.1677-1681
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    Bismuth-based solder characterization for lower-temperature assembly of thermally-sensitive components in 3D interconnect applications

    Vakanas, George
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    Vandecasteele, Bjorn  
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    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Snyder, Brad
    Meeting abstract
    2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2013
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    Chemical mechanical polishing for indium bond pad damascene processing

    Ceulemans, Karl  
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    Shafahian, Ehsan  
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    Struyf, Herbert  
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    Devriendt, Katia  
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    Deckers, Steven  
    Journal article
    2024, JAPANESE JOURNAL OF APPLIED PHYSICS, (63) 3, p.Art. 03SP39
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    Co-Sn intermetallic compoundsfor potential integration in 3D interconnects

    Vakanas, George
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    O, Minho
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    Dimcic, Biljana
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    Vandecasteele, Bjorn  
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    Vanstreels, Kris  
    Meeting abstract
    2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2014
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    Cobalt UBM for fine pitch microbump applications in 3DIC

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Vandersmissen, Kevin  
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    Dictus, Dries  
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    Di Piazza, Luca  
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224
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    Cobalt-Tin Intermetallic Compounds as Alternative Surface Finish for Low Temperature Die-to-Wafer Solder Stacking

    Inoue, Fumihiro  
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    Derakhshandeh, Jaber  
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    Gerets, Carine  
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    Beyne, Eric  
    Proceedings paper
    2021, 20th International Conference on Electronics Packaging (ICEP), MAY 12-14, 2021, p.9-10
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