Browsing by Author "Derakhshandeh, Jaber"
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Publication 10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622Publication 20 μm pitch Cu-to-Cu flip-chip interconnects through Cu nanoparticles sintering
Proceedings paper2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.1891-1895Publication 3D interconnects for quantum computing
Proceedings paper2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.821-828Publication 3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3Publication 3D stacking of Co and Ni based microbumps
; ; ; ; ;Wang, TengProceedings paper2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5Publication 3D stacking using bump-less process for sub 10μm pitches
Proceedings paper2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133Publication A novel in-situ resistance measurement to extract IMC resistivity and kinetic parameter for CoSn 3D stacks
Proceedings paper2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.7.4Publication A novel intermetallic compound insertion bonding to improve throughput for 3D die to wafer stacking
Proceedings paper2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 26/05/2020Publication A novel intermetallic compound insertion bonding to improve throughput for sequential 3D stacking
Journal article2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 4, p.669-678Publication A novel iso-thermal intermetallic compound insertion bonding approach to improve throughput for 3D die to wafer stacking
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1442-1447Publication A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly
Meeting abstract2020, IMAPS 53rd International Symposium on Microelectronics, 6/10/2020Publication A novel resistance measurement methodology for in-situ UBM/Solder interfacial reaction monitoring
Journal article2020, IEEE Transactions on Components, Packaging and Manufacturing Technology, (10) 1, p.30-38Publication A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps
Proceedings paper2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124Publication An in-situ resistance measurement to extract IMC resistivity and kinetic parameter of alternative metallurgies for 3D stacking
; ; ; ;Honore, Mia; Proceedings paper2018, 7th Electronic System-Integration Technology Conference - ESTC, 18/09/2018, p.1-8Publication An Investigation on Particle Embedding Capability of Wafer Level Spin-on Polymer Underfill Enabling Low Temperature Bonding of Hybrid Bonding Sysem
Proceedings paper2023, IEEE 73rd Electronic Components and Technology Conference (ECTC), MAY 30-JUN 02, 2023, p.1677-1681Publication Bismuth-based solder characterization for lower-temperature assembly of thermally-sensitive components in 3D interconnect applications
Meeting abstract2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2013Publication Chemical mechanical polishing for indium bond pad damascene processing
Journal article2024, JAPANESE JOURNAL OF APPLIED PHYSICS, (63) 3, p.Art. 03SP39Publication Co-Sn intermetallic compoundsfor potential integration in 3D interconnects
Meeting abstract2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2014Publication Cobalt UBM for fine pitch microbump applications in 3DIC
Proceedings paper2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224Publication Cobalt-Tin Intermetallic Compounds as Alternative Surface Finish for Low Temperature Die-to-Wafer Solder Stacking
Proceedings paper2021, 20th International Conference on Electronics Packaging (ICEP), MAY 12-14, 2021, p.9-10