Browsing by Author "Dreesen, R."
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Publication A high resolution method for measuring hot carrier degradation in matched transistor pairs
Journal article1997, Microelectronics and Reliability, (37) 10_11, p.1533-1536Publication A high resolution method for measuring hot carrier degradation in matched transistor pairs
Proceedings paper1997, Proceedings of 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 97; October 1997., p.1533-1536Publication A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Journal article2001, Microelectronics Reliability, (41) 3, p.437-443Publication A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.584-587Publication Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices
Journal article2003, Microelectronics Reliability, (43) 9_11, p.1785-1790Publication High-resolution SILC measurements of thin SiO2 at ultra low voltages
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1485-1489Publication Modelling hot carrier degradation of LDD NMOSFETs by using a high resolution measurement technique
Journal article1999, Microelectronics and Reliability, (39) 6_7, p.785-790Publication Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives
Proceedings paper2003, Proceedings of the Business of Electronic Product Reliability and Reliability, 13/01/2003Publication Statistical aspects of the degradation of LDD nMOSFETs
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1409-1413Publication The use of random effects in modeling non-linear hot-carrier degradation data
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.35-38