Browsing by Author "Grill, A."
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Publication Characteristics of low-k and ultralow-k PECVD deposited SiCOH films
Publication Efficient physical defect model applied to PBTI in high-k stacks
Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-11.1-XT-11.6Publication Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Proceedings paper2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313Publication Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Proceedings paper2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313Publication Modeling the effect of random dopants on hot-carrier degradation in FinFETs
Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.1-7Publication Porosity in plasma enhanced chemical vapor deposited SiCOH dielectrics: a comparative study
Publication Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Publication Superior NBTI in high-k SiGe transistors - Part I: experimental
Journal article2017, IEEE Transactions on Electron Devices, (64) 5, p.2092-2098Publication Superior NBTI in high-k SiGe transistors - Part II: theory
Journal article2017, IEEE Transactions on Electron Devices, (64) 5, p.2099-2105