Browsing by Author "Hall, S."
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Publication Characterization of electron traps in Si-capped Ge MOSFETs with HfO2/SiO2 gate stack
Journal article2012, IEEE Electron Device Letters, (33) 12, p.1681-1683Publication Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stack
Publication Energy distribution of positive charges in Al2O3/GeO2/Ge pMOSFETs
Journal article2014, IEEE Electron Device Letters, (35) 2, p.160-162Publication Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate
Publication Hydrogen induced positive charge in Hf-based dielectrics
Publication Process-induced positive charges in Hf-based gate stacks
Journal article2008, Journal of Applied Physics, (103) 1, p.14507Publication Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure
; Journal article2013, Microelectronic Engineering, 109, p.43-45