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Browsing by Author "Ike, Shinichi"

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    Epitaxial GeSn: Impact of process conditions on material quality

    Loo, Roger  
    ;
    Shimura, Yosuke
    ;
    Ike, Shinichi
    ;
    Vohra, Anurag  
    ;
    Stoica, Toma
    ;
    Stange, Daniela
    ;
    Buca, Dan
    Journal article
    2018, Semiconductor Science and Technology, (33) 11, p.114010
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    Epitaxial GeSn: Impact of process conditions on material quality

    Loo, Roger  
    ;
    Shimura, Yosuke
    ;
    Ike, Shinichi
    ;
    Vohra, Anurag  
    ;
    Stoica, Toma
    ;
    Stange, Daniela
    ;
    Buca, Dan
    Oral presentation
    2018, eMRS 2018 Fall Meeting, Symposium U: Monolithic and Heterogeneous Integration of Advanced Materials & Devices on Silicon
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    Epitaxial GeSn: impact of process conditions on material quality

    Loo, Roger  
    ;
    Shimura, Yosuke
    ;
    Ike, Shinichi
    ;
    Vohra, Anurag  
    ;
    Stoica, Toma
    ;
    Buca, Dan
    ;
    Kohen, David
    Meeting abstract
    2018-05, Joint ISTDM/ICSI Conference, 27/05/2018, p.195-196
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    Group IV Epi processing, evolution in CMOS from 90 to 10nm node

    Loo, Roger  
    ;
    Dhayalan, Sathish Kumar
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    Hikavyy, Andriy  
    ;
    Ike, Shinichi
    ;
    Rondas, Dirk  
    ;
    Rosseel, Erik  
    Proceedings paper
    2014, ASM 2014 Users Meeting, 25/09/2014
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    Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

    Ike, Shinichi
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    Simoen, Eddy  
    ;
    Shimura, Yosuke
    ;
    Hikavyy, Andriy  
    ;
    Vandervorst, Wilfried  
    ;
    Loo, Roger  
    Journal article
    2016, Japanese Journal of Applied Physics, (55) 4S, p.04EJ11
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    Influence of precursor gas on SiGe epitaxial material quality in terms of structural and electrical defects

    Ike, Shinichi
    ;
    Simoen, Eddy  
    ;
    Shimura, Yosuke
    ;
    Hikavyy, Andriy  
    ;
    Vandervorst, Wilfried  
    ;
    Loo, Roger  
    Proceedings paper
    2015, International Conference on Solid State Devices and Materials - SSDM, 27/09/2015, p.G4.4
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    Influence of precursor gas source on defect properties in Si1xGex epitaxial thin films

    Ike, Shinichi
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    Simoen, Eddy  
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    Shimura, Yosuke
    ;
    Hikavyy, Andriy  
    ;
    Vandervorst, Wilfried  
    ;
    Loo, Roger  
    Meeting abstract
    2015, Meeting in the Division of Crystals Science and Technology of JSAP (Japan Society of Applied Physics), 29/10/2015
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    Introduction of Sn into GeSn based group-IV thin films and its impacts

    Shimura, Yosuke
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    Ike, Shinichi
    ;
    Gencarelli, Federica
    ;
    Takeuchi, Wakana
    ;
    Sakashita, Mitsuo
    Meeting abstract
    2016-09, JSAP Autumn Meeting, 13/09/2016
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    Structural and electrical properties of low temperature CVD-grown SiGe epitaxial layers

    Ike, Shinichi
    ;
    Simoen, Eddy  
    ;
    Shimura, Yosuke
    ;
    Hikavyy, Andriy  
    ;
    Vandervorst, Wilfried  
    ;
    Loo, Roger  
    Meeting abstract
    2016, 9th International Workdhop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically, 11/01/2016
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    X-ray microdiffraction measurements to support epitaxial growth studies of strained Ge-cap / relaxed SiGe on STI nano-scale patterned Si wafers

    Loo, Roger  
    ;
    Shimura, Yosuke
    ;
    Sun, Jianwu
    ;
    Ike, Shinichi
    ;
    Inuzuka, Yuuki
    ;
    Nakatsuka, Osau
    Book
    2015

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